Dual-column-parallel CCD sensor and inspection systems using a sensor

An image sensor including:

• first and second pixels respectively configured to generate first and second image charges according to one or more pixel control signals;
• and
• a readout circuit comprising:
• first and second transfer gates configured to receive the first and second image charges from the first and second pixels, respectively;
• third and fourth transfer gates configured to receive the first and second image charges from the first and second transfer gates, respectively;
• a summing gate coupled to the third and fourth transfer gates;
• and
• an output circuit coupled to the summing gate,
• wherein the first and fourth transfer gates are coupled and the second and third transfer gates are coupled such that a first transfer gate control signal applied to the first transfer gate is substantially simultaneously applied to the fourth transfer gate, and such that a second transfer gate control signal applied to the second transfer gate is substantially simultaneously applied to the third transfer gate, and
• wherein the summing gate is configured to receive the first image charge from the third transfer gate during a first time period and to subsequently transfer the first image charge to the output circuit in accordance with a summing gate control signal, and the summing gate is further configured to receive the second image charge from the fourth transfer gate during ad second time period and to subsequently transfer the second image charge to the output circuit in accordance with the summing gate control signal.