H04J 2203/0062
Testing
H04J2203/0062 (Testing) appears on 71 US grants and 45 published applications in this corpus.
Search patents in H04J- Granted patents
- 71
- Published applications
- 45
- Assignees
- 45
- Inventors
- 152
- Latest grant
- 22 Nov 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 3 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 6 | 0 |
| 1999 | 3 | 0 |
| 2000 | 4 | 0 |
| 2001 | 2 | 5 |
| 2002 | 1 | 3 |
| 2003 | 6 | 2 |
| 2004 | 7 | 10 |
| 2005 | 2 | 1 |
| 2006 | 4 | 2 |
| 2007 | 3 | 4 |
| 2008 | 1 | 3 |
| 2009 | 6 | 4 |
| 2010 | 3 | 1 |
| 2011 | 1 | 2 |
| 2012 | 4 | 1 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 0 | 0 |
| 2016 | 1 | 2 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
| 2019 | 2 | 1 |
| 2020 | 1 | 0 |
| 2021 | 1 | 2 |
| 2022 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Signal quality information notification method and relay communication apparatus22 Nov 2022US 11,509,392 B2Nippon Telegraph and Telephone Corporation
- Optical wavelength multiplex transmission system, optical wavelength multiplex apparatus, and standby system checking method2 Nov 2021US 11,165,529 B2NEC Corporation
- Fault detection method and device25 Feb 2020US 10,575,074 B2Huawei Technologies Co., Ltd.
- Method for measuring transmission delay of optical transport network device and source OTN device23 Jul 2019US 10,361,938 B2Zte Corporation
- Electronic device and method for controlling the same9 Jul 2019US 10,348,443 B2Samsung Electronics Co., Ltd.
- Optical wavelength multiplex transmission system, optical wavelength multiplex apparatus, and standby system checking method24 Jun 2021US 2021/0194616 A1NEC Corporation
- Signal quality information notification method and relay communication apparatus29 Apr 2021US 2021/0126707 A1Nippon Telegraph and Telephone Corporation
- Fault detection method and device7 Feb 2019US 2019/0045282 A1Huawei Technologies Co., Ltd.
- Electronic device and method for controlling the same12 Apr 2018US 2018/0102867 A1Samsung Electronics Co., Ltd.
- Method for measuring transmission delay of optical transport network device and source OTN device27 Oct 2016US 2016/0315840 A1Zte Corporation
Most cited
By later US patents
- Communication line test apparatus with an improved graphical user interface80US 6,098,028 ADigital Lightwave, Inc. · 2000
- Interfacing apparatus and method for adapting Ethernet directly to physical channel72US 7,031,341 B2Wuhan Research Institute of Post and Communications, Mii. · 2006
- Method and system for testing a sonet network element54US 5,455,832 ABell Communications Research, Inc. · 1995
- Bit error rate detection system54US 5,764,651 AIntegrated Device Technology, Inc. · 1998
- Dynamic communication line analyzer apparatus and method53US 5,991,270 ADigital Lightwave, Inc. · 1999