H03M 1/109
For dc performance, i.e. static testing
Official title: {for DC performance, i.e. static testing (H03M1/1085 takes precedence)}
H03M1/109 (For dc performance, i.e. static testing) appears on 156 US grants and 115 published applications in this corpus.
Search patents in H03M- Granted patents
- 156
- Published applications
- 115
- Assignees
- 114
- Inventors
- 337
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 3 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 3 | 0 |
| 1998 | 4 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 0 |
| 2002 | 3 | 3 |
| 2003 | 7 | 4 |
| 2004 | 4 | 3 |
| 2005 | 3 | 7 |
| 2006 | 5 | 4 |
| 2007 | 0 | 1 |
| 2008 | 5 | 3 |
| 2009 | 7 | 9 |
| 2010 | 5 | 8 |
| 2011 | 10 | 11 |
| 2012 | 6 | 6 |
| 2013 | 5 | 2 |
| 2014 | 10 | 9 |
| 2015 | 12 | 8 |
| 2016 | 8 | 4 |
| 2017 | 6 | 4 |
| 2018 | 8 | 3 |
| 2019 | 5 | 3 |
| 2020 | 3 | 3 |
| 2021 | 7 | 4 |
| 2022 | 3 | 2 |
| 2023 | 3 | 6 |
| 2024 | 6 | 5 |
| 2025 | 2 | 2 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electronic device26 May 2026US 12,640,749 B2Infineon Technologies AG
- Testing ADCs3 Feb 2026US 12,542,560 B2Nordic Semiconductor ASA
- Analog-to-digital converter (ADC) having linearization circuit with reconfigurable lookup table (LUT) memory and calibration options30 Dec 2025US 12,512,846 B2Texas Instruments Incorporated
- Internally calibrated analog-to-digital converter25 Mar 2025US 12,261,617 B2Analog Devices International Unlimited Company
- AD converter and semiconductor device including the same3 Dec 2024US 12,160,245 B2Renesas Electronics Corporation
- Analog-to-digital converter (adc) having linearization circuit with reconfigurable lookup table (lut) memory and calibration options23 Apr 2026US 2026/0113051 A1Texas Instruments Incorporated
- Method and apparatus for checking plausibility of analog input data6 Nov 2025US 2025/0343625 A1Hanwha Solutions Corporation
- Method for complex hardware development error mitigation via independent analog representation of digital data10 Apr 2025US 2025/0119150 A1Hamilton Sundstrand Corporation
- Electronic device14 Nov 2024US 2024/0380409 A1Infineon Technologies AG
- Analog-to-digital converter (adc) having linearization circuit with reconfigurable lookup table (lut) memory and calibration options7 Nov 2024US 2024/0372557 A1Texas Instruments Incorporated
Most cited
By later US patents
- Fast testing of D/A converters108US 5,841,382 ALucent Technologies Inc. · 1998
- Method and apparatus for testing digital to analog and analog to digital converters56US 5,659,312 ALogicVision, Inc. · 1997
- Semiconductor integrated circuit device34US 9,100,034 B2Renesas Electronics Corporation · 2015
- Programmatically generated in-circuit test of analog to digital converters30US 4,947,106 AHewlett-Packard Company · 1990
- Apparatus and method for automated testing of integrated analog to digital converters26US 6,557,131 B1Cirrus Logic, Inc. · 2003