H01J 49/126
Other arc discharge ion sources using an applied magnetic field
Official title: {Other arc discharge ion sources using an applied magnetic field}
H01J49/126 (Other arc discharge ion sources using an applied magnetic field) appears on 22 US grants and 19 published applications in this corpus.
Search patents in H01J- Granted patents
- 22
- Published applications
- 19
- Assignees
- 6
- Inventors
- 17
- Latest grant
- 10 Dec 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 1 |
| 2014 | 2 | 1 |
| 2015 | 2 | 1 |
| 2016 | 1 | 1 |
| 2017 | 0 | 1 |
| 2018 | 4 | 3 |
| 2019 | 2 | 3 |
| 2020 | 2 | 2 |
| 2021 | 2 | 3 |
| 2022 | 1 | 0 |
| 2023 | 2 | 1 |
| 2024 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry10 Dec 2024US 12,165,863 B2Nova Measuring Instruments Ltd.
- Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry19 Sep 2023US 11,764,050 B2Nova Measuring Instruments Ltd.
- Apparatus and method for thermal assisted desorption ionization systems29 Aug 2023US 11,742,194 B2
- Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry30 Aug 2022US 11,430,647 B2Nova Measuring Instruments Ltd.
- Apparatus and method for thermal assisted desorption ionization systems29 Jun 2021US 11,049,707 B2Ionsense, Inc.
- Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry14 Mar 2024US 2024/0087869 A1Nova Measuring Instruments Ltd.
- Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry23 Mar 2023US 2023/0091625 A1Nova Measuring Instruments Ltd.
- Apparatus and method for thermal assisted desorption ionization systems21 Oct 2021US 2021/0327699 A1Ionsense, Inc.
- Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry30 Sep 2021US 2021/0305037 A1Nova Measuring Instruments Ltd.
- Inorganic mass spectrometer8 Apr 2021US 2021/0104391 A1
Most cited
By later US patents
- Apparatus and method for thermal assisted desorption ionization systems45US 8,754,365 B2Ionsense, Inc. · 2014
- Apparatus and method for thermal assisted desorption ionization systems27US 8,822,949 B2Ionsense, Inc. · 2014
- Apparatus and method for thermal assisted desorption ionization systems23US 8,963,101 B2Ionsense, Inc. · 2015
- Apparatus and method for thermal assisted desorption ionization systems22US 9,224,587 B2Ionsense, Inc. · 2015
- Apparatus and method for thermal assisted desorption ionization systems18US 9,514,923 B2Ionsense, Inc. · 2016