H01J 41/10
Of particle spectrometer type
Official title: of particle spectrometer type (particle spectrometers per se H01J49/00)
H01J41/10 (Of particle spectrometer type) appears on 10 US grants and 8 published applications in this corpus.
Search patents in H01J- Granted patents
- 10
- Published applications
- 8
- Assignees
- 11
- Inventors
- 27
- Latest grant
- 26 Nov 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 2 |
| 2011 | 0 | 0 |
| 2012 | 2 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 0 | 0 |
| 2022 | 1 | 0 |
| 2023 | 0 | 0 |
| 2024 | 1 | 1 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Chamber for an ionization vacuum gauge26 Nov 2024US 12,154,771 B2Inficon GmbH
- Quantum pressure standard and methods for determining and using same11 Jan 2022US 11,221,268 B2British Columbia Institute of Technology
- Gas analyzer23 Oct 2012US 8,296,090 B2HORIBA STEC, Co., Ltd.
- Mass spectrometry unit20 Mar 2012US 8,138,473 B2Ulvac, Inc.
- Quadrupole mass spectrometer and vacuum device using the same19 Feb 2008US 7,332,714 B2Vaclab Inc.
- Chamber for an ionization vacuum gauge6 Feb 2025US 2025/0046589 A1Inficon GmbH
- Chamber for an ionization vacuum gauge13 Jun 2024US 2024/0194465 A1Inficon GmbH
- Quantum pressure standard and methods for determining and using same23 Jan 2020US 2020/0025639 A1British Columbia Institute of Technology
- Mass spectrometry unit26 Aug 2010US 2010/0213363 A1Ulvac, Inc.
- Gas analyzer25 Mar 2010US 2010/0076712 A1HORIBA STEC, Co., Ltd.
Most cited
By later US patents
- Dual ion source17US 5,808,308 ALeybold Inficon, Inc. · 1998
- Apparatus for and method of operating quadrupole mass spectrometers in the total pressure mode16US 4,535,236 AVG Instruments Group Limited · 1985
- Method for linearization of ion currents in a quadrupole mass analyzer10US 5,889,281 ALeybold Inficon, Inc. · 1999
- Ion collecting electrode for total pressure collector9US 5,834,770 ALeybold Inficon, Inc. · 1998
- Quadrupole mass spectrometer and vacuum device using the same6US 7,332,714 B2Vaclab Inc. · 2008