Gas analyzer

A correction method of a gas analyzer equipped with an ionizer to ionize a sample gas, a first ion detector and a second ion detector each configured to detect a respective ion from the ionizer, and each being disposed a respective distance from the ionizer on an opposite side of the ionizer, the respective distances being different from each other, a filter interposed between the ionizer and the first ion detector to selectively allow ions that were ionized to pass therethrough, and an arithmetic device to analyze the sample gas by receiving a detection signal from the first ion detector and the second ion detector, the correction method comprising:

• a first total pressure measurement step to measure a first total pressure of the sample gas by the first ion detector;
• a second total pressure measurement step to measure a second total pressure of the sample gas by the second ion detector;
• a partial pressure measurement step to cause the first ion detector to measure a partial pressure of a specific component selected by the filter;
• and
• a correction step to correct the partial pressure by using the first total pressure and the second total pressure.

A gas analyzer arithmetic device used for a gas analyzer comprising:

• an ionizer to ionize a sample gas;
• a first ion detector and a second ion detector each configured to detect a respective ion from the ionizer, and each being disposed a respective distance from the ionizer on an opposite side of the ionizer, the respective distances being different from each other;
• and
• a filter interposed between the ionizer and the first ion detector to selectively allow ions from the ionizer to pass therethrough, wherein a first total pressure of the sample gas obtained from the first ion detector and a second total pressure of the sample gas obtained from the second ion detector are used to correct a partial pressure of a specific component obtained from the first ion detector and selected by the filter.