H01J 2229/481
Focusing electrodes
H01J2229/481 (Focusing electrodes) appears on 31 US grants and 31 published applications in this corpus.
Search patents in H01J- Granted patents
- 31
- Published applications
- 31
- Assignees
- 24
- Inventors
- 82
- Latest grant
- 21 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2001 | 0 | 1 |
| 2002 | 5 | 8 |
| 2003 | 6 | 4 |
| 2004 | 4 | 2 |
| 2005 | 3 | 3 |
| 2006 | 2 | 2 |
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 3 |
| 2016 | 2 | 1 |
| 2017 | 1 | 1 |
| 2018 | 0 | 1 |
| 2019 | 0 | 0 |
| 2020 | 3 | 0 |
| 2021 | 0 | 2 |
| 2022 | 2 | 0 |
| 2023 | 1 | 2 |
| 2024 | 0 | 0 |
| 2025 | 1 | 0 |
By publication year.
Subgroups
Granted patents
Recent patents
- Extreme-ultraviolet light source device using electron beams21 Oct 2025US 12,451,316 B2Worldbeam Solution Co., Ltd.
- Precision alignment system for millimeter wave sources2 May 2023US 11,640,893 B1Dymenso LLC
- Field emission device24 May 2022US 11,342,153 B2Electronics and Telecommunications Research Institute
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device25 Jan 2022US 11,232,924 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device8 Dec 2020US 10,861,666 B1ICT Integrated Circuit Testing Gesellschaft für Halbletterprüftechnik mbH
- Precision Alignment System for Millimeter Wave Sources18 May 2023US 2023/0154717 A1Dymenso LLC
- Extreme-ultraviolet light source device using electron beams20 Apr 2023US 2023/0122253 A1University-Industry Cooperation Group of Kyung Hee University
- Field emission device30 Sep 2021US 2021/0305002 A1Electronics and Telecommunications Research Institute
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device5 Aug 2021US 2021/0241990 A1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Electron beam projector with linear thermal cathode16 Aug 2018US 2018/0233316 A1State Enterprise "International Center for Electron Beam Technologi
Most cited
By later US patents
- X-ray tube5US 9,653,248 B2Toshiba Electron Tubes & Devices Co., Ltd. · 2017
- Color picture tube including an electron gun in a coated tube neck4US 6,559,586 B1Samsung Display Devices Co., Ltd. · 2003
- Cathode-ray tube apparatus4US 6,570,349 B2Kabushiki Kaisha Toshiba · 2003
- Cathode-ray tube apparatus3US 6,707,244 B2Kabushiki Kaisha Toshiba · 2004
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device2US 10,861,666 B1ICT Integrated Circuit Testing Gesellschaft für Halbletterprüftechnik mbH · 2020