G06F 11/2221
To test input/output devices or peripheral units
Official title: {to test input/output devices or peripheral units}
G06F11/2221 (To test input/output devices or peripheral units) appears on 647 US grants and 533 published applications in this corpus.
Search patents in G06F- Granted patents
- 647
- Published applications
- 533
- Assignees
- 333
- Inventors
- 1,638
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 3 | 0 |
| 1978 | 2 | 0 |
| 1979 | 2 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 3 | 0 |
| 1983 | 3 | 0 |
| 1984 | 4 | 0 |
| 1985 | 1 | 0 |
| 1986 | 8 | 0 |
| 1987 | 6 | 0 |
| 1988 | 4 | 0 |
| 1989 | 9 | 0 |
| 1990 | 6 | 0 |
| 1991 | 4 | 0 |
| 1992 | 6 | 0 |
| 1993 | 7 | 0 |
| 1994 | 5 | 0 |
| 1995 | 13 | 0 |
| 1996 | 20 | 0 |
| 1997 | 7 | 0 |
| 1998 | 17 | 0 |
| 1999 | 14 | 0 |
| 2000 | 13 | 0 |
| 2001 | 13 | 0 |
| 2002 | 9 | 3 |
| 2003 | 9 | 5 |
| 2004 | 7 | 11 |
| 2005 | 6 | 13 |
| 2006 | 7 | 14 |
| 2007 | 10 | 18 |
| 2008 | 6 | 16 |
| 2009 | 12 | 16 |
| 2010 | 14 | 17 |
| 2011 | 11 | 11 |
| 2012 | 9 | 16 |
| 2013 | 12 | 20 |
| 2014 | 16 | 34 |
| 2015 | 27 | 29 |
| 2016 | 30 | 33 |
| 2017 | 30 | 34 |
| 2018 | 30 | 37 |
| 2019 | 41 | 33 |
| 2020 | 46 | 28 |
| 2021 | 36 | 26 |
| 2022 | 21 | 23 |
| 2023 | 21 | 25 |
| 2024 | 29 | 33 |
| 2025 | 25 | 24 |
| 2026 | 12 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Memory sub-system testing and validation6 Oct 2026US 12,754,813 B2Micron Technology, Inc.
- Graphics system operation failure detection14 Jul 2026US 12,681,812 B2Denso Corporation
- Video call method and related device9 Jun 2026US 12,652,368 B2Huawei Technologies Co., Ltd.
- Server rack mountable automated test platform for transaction device testing26 May 2026US 12,639,688 B2Disney Enterprises, Inc.
- Multimodal trajectory information processing and analysis system based on man-machine interaction terminal12 May 2026US 12,625,584 B2Kingfar International Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310563 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310564 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310565 A1Communications Test Design, Inc.
- Electronic device logistics and testing system8 Oct 2026US 2026/0310566 A1Communications Test Design, Inc.
- Method of data corruption on an uart communication bus8 Oct 2026US 2026/0310568 A1Microchip Technology Incorporated
Most cited
By later US patents
- Self-test and status reporting system for microcontroller-controlled devices1,247US 6,104,304 AConexant Systems, Inc. · 2000
- Apparatus and method for testing master logic units within a data processing apparatus241US 6,463,488 B1Arm Limited · 2002
- Serial ATA disk drive having a parallel ATA test interface and method211US 6,976,190 B1Western Digital Technologies, Inc. · 2005
- Devices and method for generating and using systems, software waitstates on address boundaries in data processing197US 5,155,812 ATexas Instruments Incorporated · 1992
- Arithmetic built-in self test of multiple scan-based integrated circuits174US 5,991,898 AMentor Graphics Corporation · 1999