G05B 2219/37448
Inspection process planner
G05B2219/37448 (Inspection process planner) appears on 13 US grants and 18 published applications in this corpus.
Search patents in G05B- Granted patents
- 13
- Published applications
- 18
- Assignees
- 17
- Inventors
- 61
- Latest grant
- 2 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 1 | 1 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 2 |
| 2017 | 0 | 1 |
| 2018 | 2 | 2 |
| 2019 | 1 | 1 |
| 2020 | 1 | 2 |
| 2021 | 2 | 2 |
| 2022 | 0 | 1 |
| 2023 | 1 | 1 |
| 2024 | 0 | 3 |
| 2025 | 1 | 0 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Generation of measurement strategy for measuring a measurement object2 Jun 2026US 12,645,192 B2Carl Zeiss Industrielle Messtechnik GmbH
- Method for aligning a workpiece in a machine tool25 Feb 2025US 12,235,621 B2Dr. Johannes Heidenhain GmbH
- Method for enhancing the semiconductor manufacturing yield20 Jun 2023US 11,681,279 B2ASML Netherlands B. V.
- Component testing plan considering distinguishable and undistinguishable components24 Aug 2021US 11,099,107 B2International Business Machines Corporation
- Recipe creation device for use in semiconductor measurement device or semiconductor inspection device20 Apr 2021US 10,984,143 B2Hitachi High-Tech Corporation
- Methods of and systems for robotic inspection12 Dec 2024US 2024/0414439 A1Kitov Systems Ltd
- Inspection management system, inspection management device, inspection management method, and program26 Sep 2024US 2024/0319703 A1OMRON Corporation
- Inspection system, inspection management device, inspection program creating method, and program4 Jul 2024US 2024/0224485 A1OMRON Corporation
- Method for aligning a workpiece in a machine tool23 Mar 2023US 2023/0088649 A1Dr. Johannes Heidenhain GmbH
- Work machine service part selection system24 Feb 2022US 2022/0057773 A1Hitachi Construction Machinery Co., Ltd.
Most cited
By later US patents
- Method and apparatus for determining a sampling plan based on process and equipment state information15US 6,821,792 B1Advanced Micro Devices, Inc. · 2004
- GUI for programming step and repeat operations in a machine vision inspection system8US 8,271,895 B2Mitutoyo Corporation · 2012
- Method and apparatus for adaptive sampling based on process covariance6US 6,985,825 B1Advanced Micro Devices, Inc. · 2006
- Machine learning device, robot control system, and machine learning method4US 10,596,698 B2Fanuc Corporation · 2020
- Measurement project analyzer4US 8,527,964 B2National Instruments Corporation · 2013