Inspection system, inspection management device, inspection program creating method, and program

An inspection management device that is a device configured to manage an inspection by an inspection system including (1+n) types of imaging units each configured to capture an image of a component-mounted substrate that is an inspection target and acquire image data and (1+m) types of inspection units each configured to perform, on the basis of (1+n) types of the image data respectively acquired by the (1+n) types of imaging units, an inspection corresponding to each of the (1+n) types of image data, the inspection management device comprising:

• an inspection suitability calculation unit configured to calculate, for each of inspection items related to each of components mounted on the component-mounted substrate, inspection suitabilities each indicating a suitability of each of (1+m) types of the inspections performed by the (1+m) types of inspection units for detecting an abnormality according to the inspection item;
• and
• an inspection program creation unit configured to create or update an inspection program for the component-mounted substrate,
• wherein the inspection program creation unit determines, on the basis of the inspection suitabilities, whether to perform each of the (1+m) types of inspections for each of the inspection items related to each of the components mounted on the component-mounted substrate.