G05B 2219/37127
Spm scanning probe microscopy, stm scanning tunneling microscopy
G05B2219/37127 (Spm scanning probe microscopy, stm scanning tunneling microscopy) appears on 5 US grants and 6 published applications in this corpus.
Search patents in G05B- Granted patents
- 5
- Published applications
- 6
- Assignees
- 3
- Inventors
- 13
- Latest grant
- 29 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2014 | 0 | 1 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 1 | 0 |
| 2018 | 0 | 1 |
| 2019 | 1 | 1 |
| 2020 | 0 | 1 |
| 2021 | 0 | 0 |
| 2022 | 1 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
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Recent patents
- Dynamic sampling method and device for semiconductor manufacture29 Jul 2025US 12,372,953 B2Winbond Electronics Corp.
- Method for validating measurement data7 Jun 2022US 11,353,324 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method for validating measurement data31 Dec 2019US 10,520,303 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method for validating measurement data21 Nov 2017US 9,823,066 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method for validating measurement data2 Aug 2016US 9,404,743 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Dynamic sampling method and device for semiconductor manufacture8 Feb 2024US 2024/0045408 A1Winbond Electronics Corp.
- Method for Validating Measurement Data23 Apr 2020US 2020/0124411 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Measurement method and apparatus13 Jun 2019US 2019/0178618 A1Renishaw PLC
- Method for Validating Measurement Data8 Mar 2018US 2018/0066939 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method for Validating Measurement Data3 Nov 2016US 2016/0320183 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents