Measurement method and apparatus
AssigneeRenishaw PLC
InventorsDavid Roberts MCMURTRY, John Charles OULD
Life of this patent
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Abstract
A method is described for measuring an object using a machine tool and a scanning probe. The scanning probe is driven along a scan path relative to the object whilst the scanning probe acquires probe data describing a series of positions on the surface of the object relative to the scanning probe. The scan path includes at least a first scan path segment for producing probe data that can be analysed to measure the object. The scan path is also arranged to impart a plurality of identifiable probe motions to the scanning probe that can be identified from the acquired probe data alone. Each identifiable probe motion is used to define a time stamp. This allows the probe data to be tied to commanded or nominal positions around the scan path.
Claims15
A method for measuring an object using a machine tool apparatus comprising a scanning probe, the method comprising driving the scanning probe along a scan path relative to the object whilst the scanning probe acquires probe data describing a series of positions on the surface of the object relative to the scanning probe, the scan path comprising at least a first scan path segment for producing probe data that can be analysed to measure the object,
- wherein the scan path is also arranged to impart a plurality of identifiable probe motions to the scanning probe that can be identified from the acquired probe data alone, each identifiable probe motion defining a time stamp.
An apparatus comprising a machine tool and a scanning probe, the machine tool comprising a controller for moving the scanning probe, wherein the apparatus is configured to drive the scanning probe along a scan path relative to the object whilst the scanning probe acquires probe data describing a series of positions on the surface of the object relative to the scanning probe, the scan path comprising at least a first scan path segment for producing probe data that can be analysed to measure the object,
- wherein the scan path is also arranged to impart a plurality of identifiable probe motions to the scanning probe that can be identified from the acquired probe data alone, each identifiable probe motion defining a time stamp.
Dependencies are inferred from the claim text.