G05B 2219/32058
Execute program as function of deviation from predicted state, result
G05B2219/32058 (Execute program as function of deviation from predicted state, result) appears on 15 US grants and 14 published applications in this corpus.
Search patents in G05B- Granted patents
- 15
- Published applications
- 14
- Assignees
- 5
- Inventors
- 18
- Latest grant
- 30 Apr 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2003 | 2 | 5 |
| 2004 | 3 | 1 |
| 2005 | 0 | 2 |
| 2006 | 2 | 2 |
| 2007 | 1 | 1 |
| 2008 | 3 | 1 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 1 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
By publication year.
Recent patents
- System and method for explanation of condition predictions in complex systems30 Apr 2024US 11,972,178 B2Falkonry Inc.
- Manufacturing design and process analysis system1 Jul 2014US 8,768,500 B2
- Manufacturing design and process analysis system29 Mar 2011US 7,917,234 B2
- Methods and systems for detecting deviation of a process variable from expected values2 Feb 2010US 7,657,399 B2Fisher-Rosemount Systems, Inc.
- System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equation11 Mar 2008US 7,343,217 B2Hitachi, Ltd.
- System and method for explanation of condition predictions in complex systems29 Aug 2019US 2019/0265674 A1Falkonry Inc.
- Manufacturing Design and Process Analysis System21 Jul 2011US 2011/0178622 A1
- Methods and systems for detecting deviation of a process variable from expected values31 Jan 2008US 2008/0027677 A1Fisher-Rosemount Systems, Inc.
- Manufacturing Design and Process Analysis System20 Sep 2007US 2007/0219657 A1
- Method of monitoring and/or controlling a semiconductor manufacturing apparatus and system therefor21 Sep 2006US 2006/0212156 A1Hitachi, Ltd.
Most cited
By later US patents
- Manufacturing design and process analysis system44US 6,687,558 B22004
- Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system therefor33US 6,616,759 B2Hitachi, Ltd. · 2003
- Manufacturing design and process analysis system32US 7,187,992 B22007
- Methods and systems for detecting deviation of a process variable from expected values15US 7,657,399 B2Fisher-Rosemount Systems, Inc. · 2010
- Manufacturing design and process analysis system14US 7,072,808 B22006