G05B 2219/31356
Automatic fault detection and isolation
G05B2219/31356 (Automatic fault detection and isolation) appears on 61 US grants and 89 published applications in this corpus.
Search patents in G05B- Granted patents
- 61
- Published applications
- 89
- Assignees
- 61
- Inventors
- 246
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 2 |
| 2004 | 4 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 5 |
| 2007 | 3 | 2 |
| 2008 | 1 | 3 |
| 2009 | 3 | 4 |
| 2010 | 4 | 0 |
| 2011 | 1 | 2 |
| 2012 | 2 | 1 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 0 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 5 |
| 2018 | 1 | 3 |
| 2019 | 3 | 7 |
| 2020 | 5 | 6 |
| 2021 | 4 | 6 |
| 2022 | 7 | 10 |
| 2023 | 7 | 12 |
| 2024 | 8 | 10 |
| 2025 | 2 | 4 |
| 2026 | 1 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Information processing method, information processing apparatus, molding machine system and non-transitory computer readable recording medium25 Aug 2026US 12,717,312 B2The Japan Steel Works, Ltd.
- Method and apparatus for fault isolation, computer device, medium and program product1 Jul 2025US 12,347,093 B2China Electronics Reliability And Environmental Testing Institute
- Semiconductor manufacturing system, behavior recognition device and semiconductor manufacturing method25 Mar 2025US 12,259,709 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method and system for detecting equipment malfunctions and/or defects in a workpiece12 Nov 2024US 12,138,725 B2Linari Engineering S.R.L
- Industrial Internet of Things for solving manufacturing problems, control methods, and storage medium1 Oct 2024US 12,105,497 B2Chengdu Qinchuan Iot Technology Co., Ltd.
- Facility abnormality determination device, abnormality determination system, abnormality determination method, control method for abnormality determination system, and abnormality determination program9 Jul 2026US 2026/0194886 A1Mitsubishi Heavy Industries, Ltd.
- Systems, apparatus, articles of manufacture, and methods for sequence of event generation for a process control system29 Jan 2026US 2026/0029782 A1Fisher-Rosemount Systems, Inc.
- Method and system for monitoring a fleet of assets29 Jan 2026US 2026/0031761 A1Siemens Aktiengesellschaft
- DCS Software Troubleshooting Assistant27 Nov 2025US 2025/0362665 A1ABB Schweiz AG
- Semiconductor manufacturing system, behavior recognition device and semiconductor manufacturing method12 Jun 2025US 2025/0189950 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Semiconductor manufacturing process monitoring544US 7,720,560 B2International Business Machines Corporation · 2010
- System for remote diagnosis of device troubles72US 6,065,136 AShimadzu Corporation · 2000
- Fault detection and classification (FDC) using a run-to-run controller45US 7,477,960 B2Tokyo Electron Limited · 2009
- Building system with adaptive fault detection21US 11,243,523 B2Johnson Controls Tyco IP Holdings LLP · 2022
- Distributed industrial performance monitoring and analytics18US 10,649,449 B2Fisher-Rosemount Systems, Inc. · 2020