G03H 2224/04
Particle beam
Official title: Particle beam, e.g. e-beam
G03H2224/04 (Particle beam) appears on 34 US grants and 33 published applications in this corpus.
Search patents in G03H- Granted patents
- 34
- Published applications
- 33
- Assignees
- 20
- Inventors
- 59
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 1 |
| 2004 | 0 | 3 |
| 2005 | 1 | 2 |
| 2006 | 3 | 1 |
| 2007 | 1 | 2 |
| 2008 | 2 | 1 |
| 2009 | 0 | 0 |
| 2010 | 2 | 2 |
| 2011 | 0 | 0 |
| 2012 | 1 | 1 |
| 2013 | 0 | 1 |
| 2014 | 3 | 1 |
| 2015 | 1 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 1 | 0 |
| 2019 | 0 | 3 |
| 2020 | 1 | 1 |
| 2021 | 1 | 4 |
| 2022 | 2 | 1 |
| 2023 | 4 | 3 |
| 2024 | 2 | 2 |
| 2025 | 3 | 2 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Correction of aberrations in in-line electron holography19 May 2026US 12,632,943 B2FEI Company
- Diffraction sheet and method for manufacturing the same, three-dimensional display device, light beam reproduction device, three-dimensional spatial display system, light beam reproduction method, and program19 Aug 2025US 12,392,939 B2Toppan Inc.
- Out-of-plane computer-generated multicolor waveguide holography1 Apr 2025US 12,265,358 B2
- Bifocal electron microscope4 Feb 2025US 12,216,068 B2FEI Company
- Arrangement and method for detecting a measured value on the basis of electron holography16 Jul 2024US 12,038,720 B2Technische UniversitäT Berlin
- Correction of aberrations in in-line electron holography4 Dec 2025US 2025/0371687 A1FEI Company
- Bifocal electron microscope15 May 2025US 2025/0155387 A1FEI Company
- Diffraction sheet and method for manufacturing the same, three-dimensional display device, light beam reproduction device, three-dimensional spatial display system, light beam reproduction method, and program12 Dec 2024US 2024/0411066 A1Toppan Inc.
- Bifocal electron microscope15 Aug 2024US 2024/0272100 A1FEI Company
- Diffraction sheet and method for manufacturing the same, three-dimensional display device, light beam reproduction device, three-dimensional spatial display system, light beam reproduction method, and program29 Jun 2023US 2023/0204832 A1Toppan Inc.
Most cited
By later US patents
- Method for producing a display with a diffraction grating pattern and a display produced by the method90US 5,058,992 AToppan Printing Co., Ltd. · 1991
- Process for making holographic embossing tools50US 5,521,030 A1996
- Method for producing a synthetic hologram24US 4,109,996 ASentralinstitutt for Industriell Forskning · 1978
- Optical element and manufacturing method thereof16US 6,618,190 B2Dai Nippon Printing Co.Ltd. · 2003
- Continuous phase and amplitude holographic elements14US 5,393,634 AThe United States of America as represented by the Administrator of the National Aeronautics and Space Administration · 1995