G02B 27/4255
For alignment or positioning purposes
Official title: {for alignment or positioning purposes (optical displacement encoding scales G01D5/347)}
G02B27/4255 (For alignment or positioning purposes) appears on 101 US grants and 92 published applications in this corpus.
Search patents in G02B- Granted patents
- 101
- Published applications
- 92
- Assignees
- 81
- Inventors
- 229
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 1 |
| 2002 | 3 | 2 |
| 2003 | 1 | 3 |
| 2004 | 2 | 3 |
| 2005 | 2 | 3 |
| 2006 | 2 | 4 |
| 2007 | 4 | 4 |
| 2008 | 4 | 4 |
| 2009 | 1 | 4 |
| 2010 | 1 | 4 |
| 2011 | 1 | 0 |
| 2012 | 4 | 2 |
| 2013 | 1 | 0 |
| 2014 | 2 | 2 |
| 2015 | 1 | 1 |
| 2016 | 4 | 8 |
| 2017 | 6 | 7 |
| 2018 | 6 | 5 |
| 2019 | 10 | 5 |
| 2020 | 9 | 9 |
| 2021 | 5 | 4 |
| 2022 | 5 | 7 |
| 2023 | 3 | 3 |
| 2024 | 5 | 4 |
| 2025 | 2 | 2 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and apparatus for diffraction-based overlay measurement26 May 2026US 12,638,784 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method and device for compensating beam angle variations of a beam bundle of laser beams generated by a diffractive optical element20 May 2025US 12,306,414 B2VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH
- Systems and methods for alignment of wavelength beam combining resonators4 Feb 2025US 12,216,291 B2Panasonic Intellectual Property Management Co., Ltd.
- Optical-based validation of orientations of internal facets3 Sep 2024US 12,078,476 B2Lumus Ltd.
- Display device and method of manufacturing the same28 May 2024US 11,994,697 B2Samsung Display Co., Ltd.
- Method and apparatus for diffraction-based overlay measurement27 Aug 2026US 2026/0251982 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Monolithic Homodyne Encoder30 Oct 2025US 2025/0334725 A1The United States of America as represented by the Secretary of the Navy
- Multi-camera cross reality device2 Jan 2025US 2025/0005795 A1Magic Leap, Inc.
- Optical-based validation of orientations of internal facets28 Nov 2024US 2024/0393108 A1Lumus Ltd.
- Systems and methods for alignment of wavelength beam combining resonators17 Oct 2024US 2024/0345409 A1Panasonic Intellectual Property Managemnet Co., Ltd.
Most cited
By later US patents
- Grating based phase control optical delay line535US 6,111,645 AMassachusetts Institute of Technology · 2000
- Interferometeric imaging with a grating based phase control optical delay line475US 6,421,164 B2Massachusetts Institute of Technology · 2002
- Grating based phase control optical delay line383US 6,282,011 B1Massachusetts Institute of Technology · 2001
- Spectroscopically measured overlay target118US 7,061,615 B1Nanometrics Incorporated · 2006
- Grating test patterns and methods for overlay metrology117US 6,699,624 B2Timbre Technologies, Inc. · 2004