G01R 35/00
Testing or calibrating of apparatus covered by the other groups of this
Official title: Testing or calibrating of apparatus covered by the other groups of this subclass
G01R35/00 (Testing or calibrating of apparatus covered by the other groups of this) appears on 2,874 US grants and 2,823 published applications in this corpus.
Search patents in G01R- Granted patents
- 2,874
- Published applications
- 2,823
- Assignees
- 1,285
- Inventors
- 6,007
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 5 | 0 |
| 1978 | 12 | 0 |
| 1979 | 4 | 0 |
| 1980 | 6 | 0 |
| 1981 | 10 | 0 |
| 1982 | 8 | 0 |
| 1983 | 6 | 0 |
| 1984 | 4 | 0 |
| 1985 | 9 | 0 |
| 1986 | 5 | 0 |
| 1987 | 16 | 0 |
| 1988 | 18 | 0 |
| 1989 | 23 | 0 |
| 1990 | 14 | 0 |
| 1991 | 15 | 0 |
| 1992 | 18 | 0 |
| 1993 | 15 | 0 |
| 1994 | 17 | 0 |
| 1995 | 25 | 0 |
| 1996 | 20 | 0 |
| 1997 | 28 | 0 |
| 1998 | 27 | 0 |
| 1999 | 18 | 0 |
| 2000 | 25 | 0 |
| 2001 | 27 | 5 |
| 2002 | 36 | 23 |
| 2003 | 31 | 36 |
| 2004 | 43 | 49 |
| 2005 | 40 | 72 |
| 2006 | 79 | 71 |
| 2007 | 45 | 56 |
| 2008 | 44 | 67 |
| 2009 | 34 | 69 |
| 2010 | 59 | 75 |
| 2011 | 60 | 80 |
| 2012 | 49 | 84 |
| 2013 | 76 | 139 |
| 2014 | 94 | 146 |
| 2015 | 97 | 219 |
| 2016 | 148 | 153 |
| 2017 | 218 | 161 |
| 2018 | 160 | 165 |
| 2019 | 191 | 179 |
| 2020 | 191 | 153 |
| 2021 | 188 | 145 |
| 2022 | 136 | 130 |
| 2023 | 128 | 150 |
| 2024 | 134 | 146 |
| 2025 | 131 | 158 |
| 2026 | 86 | 92 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Electronic device and method for calibrating temperature related scattering matrix of temperature sensitive device6 Oct 2026US 12,754,080 B2Mediatek Inc.
- Device inspection apparatus and device inspection method6 Oct 2026US 12,754,233 B2Mitsubishi Electric Corporation
- Computing device current sensor calibration trigger15 Sep 2026US 12,736,603 B2QUALCOMM Incorporated
- Current transformer polarity verification15 Sep 2026US 12,738,416 B2Google Inc.
- 5-PS-resolution waveform-capture-device on a field-programmable gate-array with dynamic phase-shifting8 Sep 2026US 12,730,174 B2Ohio State Innovation Foundation
- Signal injection based electrical arc detection8 Oct 2026US 2026/0309766 A1Tesla, Inc.
- Test and/or measurement system8 Oct 2026US 2026/0309826 A1
- Method for rapid localization of dam leakage passage based on gradient measurement of total magnetic field1 Oct 2026US 2026/0298765 A1Central South University
- On-die power sensor for performing run-time power/voltage/current management1 Oct 2026US 2026/0298990 A1Mediatek Inc.
- Crosstalk tolerant lrrm auto-load inductance calibration1 Oct 2026US 2026/0299072 A1Qorvo US, Inc.
Most cited
By later US patents
- Computerized solid state energy meter test system and method of testing201US 6,262,569 B1Utility Test Equipment Company · 2001
- Method and apparatus for calibrating a magnetic field generator184US 6,335,617 B12002
- Electronic battery tester172US 6,323,650 B1Midtronics, Inc. · 2001
- Apparatus for calibrating electronic battery tester159US 6,304,087 B1Midtronics, Inc. · 2001
- Method and apparatus for providing and calibrating a multiport network analyzer156US 5,578,932 AATN Microwave, Inc. · 1996