G01R 35/002
Testing or calibrating of apparatus covered by the other groups of this
Official title: {of cathode ray oscilloscopes}
G01R35/002 (Testing or calibrating of apparatus covered by the other groups of this) appears on 44 US grants and 24 published applications in this corpus.
Search patents in G01R- Granted patents
- 44
- Published applications
- 24
- Assignees
- 24
- Inventors
- 88
- Latest grant
- 4 Apr 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 2 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 4 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 4 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 1 |
| 2002 | 3 | 1 |
| 2003 | 3 | 3 |
| 2004 | 2 | 1 |
| 2005 | 1 | 0 |
| 2006 | 0 | 2 |
| 2007 | 1 | 2 |
| 2008 | 1 | 2 |
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
| 2011 | 0 | 2 |
| 2012 | 2 | 2 |
| 2013 | 1 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 1 | 0 |
| 2020 | 0 | 2 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method of customized setting as well as measurement system4 Apr 2023US 11,619,920 B2Rohde & Schwarz GmbH & Co.KG
- Test system and method for testing a device under test having several communication lanes6 Apr 2021US 10,969,455 B2Rohde & Schwarz GmbH & Co.KG
- Measuring device and a method for measuring a high-frequency signal with deembedding1 Jan 2019US 10,168,411 B2Rohde & Schwarz GmbH & Co.KG
- Method of calibrating interleaved digitizer channels22 Jul 2014US 8,788,234 B2Tektronix, Inc.
- Self-calibration circuit with gyrated output impedance21 May 2013US 8,446,143 B2National Instruments Corporation
- Test fixture, calibration setup and method of calibrating a test and/or measurement instrument1 Jan 2026US 2026/0003020 A1
- Multiple output instrument calibrator22 May 2025US 2025/0164594 A1Fluke Corporation
- Method of customized setting as well as measurement system8 Oct 2020US 2020/0319615 A1Rohde & Schwarz GmbH & Co.KG
- Test system as well as method for testing a device under test16 Apr 2020US 2020/0116812 A1Rohde & Schwarz GmbH & Co.KG
- Probe for a signal analyzing device29 Mar 2018US 2018/0088151 A1
Most cited
By later US patents
- Self-calibration of an oscilloscope using a square-wave test signal41US 6,269,317 B1LeCroy Corporation · 2001
- Method and apparatus for programmable and remote numeric control and calibration of electronic instrumentation30US 4,162,531 AHewlett-Packard Company · 1979
- Automatic calibration system for video displays in vision testing30US 4,415,921 ANicolet Instrument Corporation · 1983
- Automatic vertical calibration method and system for an oscilloscope27US 4,553,091 ATektronix, Inc. · 1985
- Digital frequency response compensator and arbitrary response generator system24US 6,701,335 B2LeCroy Corporation · 2004