Probe for a signal analyzing device
OwnerBarry Rowlandinventor
Life of this patent
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Abstract
A probe connectable to a signal analyzing device, said probe comprising an integrated reference signal generator adapted to generate a reference signal applied to a probe sensing area of said probe; and an integrated measurement circuit adapted to measure a probe signal provided by said probe sensing area in response to the applied reference signal.
Claims20
A probe connectable to a signal analyzing device, said probe comprising:
- an integrated reference signal generator adapted to generate a reference signal applied to a probe sensing area of said probe;
- and
- an integrated measurement circuit adapted to measure a probe signal provided by said probe sensing area in response to the applied reference signal.
A current probe connectable to a signal analyzing device comprising:
- an integrated reference signal generator adapted to generate a calibration current applied as a first reference signal to a current probe sensing area of said current probe and adapted to generate a calibration voltage applied as a second reference signal to a tip of a voltage probe sensing area of a voltage probe touching a landing pin of said current probe;
- and
- an integrated measurement circuit adapted to measure a current probe signal provided by the current probe sensing area of said current probe.
A signal analyzing device comprising:
- a first port adapted to connect a current probe to receive a current probe signal measured by said current probe in response to a calibration current generated by a reference signal generator integrated in said current probe;
- a second port adapted to connect a voltage probe to receive a voltage probe signal measured by said voltage probe in response to a calibration voltage generated by the reference signal generator integrated in said current probe and applied to said voltage probe;
- and
- a probe skew determination unit adapted to determine automatically a probe skew between a current probe connected to the first port and a voltage probe connected to the second port of said signal analyzing device on the basis of the received current probe signal and the received voltage probe signal.
A method for calibrating a probe connectable to a signal analyzing device, the method comprising the steps of:
- applying a reference signal generated by a reference signal generator integrated in said probe to a probe sensing area of said probe;
- measuring a probe signal generated by the probe sensing area of said probe in response to the applied reference signal by a measurement circuit of said probe;
- and
- comparing the reference signal and the probe signal to calibrate said probe.
A method for determining a probe skew between a current probe and a voltage probe, the method comprising the steps of:
- providing a current probe signal measured by a current probe in response to a calibration current generated by a reference signal generator of said current probe;
- providing a voltage probe signal measured by a voltage probe in response to a time-aligned calibration voltage generated by the reference signal generator of said current probe and applied to the voltage probe;
- and
- determining the probe skew between the current probe and the voltage probe on the basis of the provided current probe signal and the provided voltage probe signal.
Dependencies are inferred from the claim text.