G01N 2223/414
Stereoscopic system
Official title: stereoscopic system
G01N2223/414 (Stereoscopic system) appears on 17 US grants and 25 published applications in this corpus.
Search patents in G01N- Granted patents
- 17
- Published applications
- 25
- Assignees
- 26
- Inventors
- 74
- Latest grant
- 10 Dec 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2005 | 0 | 1 |
| 2006 | 0 | 1 |
| 2007 | 0 | 1 |
| 2008 | 2 | 0 |
| 2009 | 0 | 2 |
| 2010 | 0 | 1 |
| 2011 | 1 | 0 |
| 2012 | 1 | 1 |
| 2013 | 0 | 1 |
| 2014 | 1 | 5 |
| 2015 | 0 | 0 |
| 2016 | 3 | 0 |
| 2017 | 0 | 1 |
| 2018 | 0 | 0 |
| 2019 | 3 | 3 |
| 2020 | 2 | 1 |
| 2021 | 1 | 1 |
| 2022 | 1 | 1 |
| 2023 | 1 | 1 |
| 2024 | 1 | 0 |
| 2025 | 0 | 1 |
| 2026 | 0 | 3 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- X-ray imaging system comprising a shutter and method10 Dec 2024US 12,165,781 B2Robotic Technologies Limited
- Method for detecting a critical defect in a ceramic rolling element16 May 2023US 11,650,170 B2Aktiebolaget Skf
- Inspection method and manufacturing method for molded resin product as well as inspection device and manufacturing device for molded resin product8 Nov 2022US 11,493,459 B2Toray Industries, Inc.
- Neutron radiography method and apparatus for the implementation thereof20 Jul 2021US 11,067,517 B2State Atomic Energy Corporation "Rosatom" On Behalf of the Russian Federation
- Apparatus and method for three-dimensional inspection of an object by x-rays29 Dec 2020US 10,874,364 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Method for evaluating defect position in depth direction of wafer18 Jun 2026US 2026/0168944 A1Shin-Etsu Handotai Co., Ltd.
- Multiple focal spots for high resolution computed tomography16 Apr 2026US 2026/0105666 A1The Johns Hopkins University
- Automated system for rapid X-ray screening of hand luggage12 Feb 2026US 2026/0043937 A1Linev Systems, Inc.
- System and method for extraction of structural data of a sample from scan data10 Apr 2025US 2025/0116617 A1Yeda Research and Development Co. Ltd.
- A device for testing a flat plate-shaped material5 Oct 2023US 2023/0314346 A1Force Technology
Most cited
By later US patents
- X-ray system and method for tomosynthetic scanning13US 7,945,014 B2Siemens Aktiengesellschaft · 2011
- Method and system of material identification using binocular steroscopic and multi-energy transmission images11US 8,194,953 B2Nuctech Company Limited · 2012
- Method and system unit for stereoscopic x-ray imaging9US 8,908,826 B2Siemens Aktiengesellschaft · 2014
- Method and apparatus for inspecting semiconductor device4US 7,368,713 B2Hitachi High-Technologies Corporation · 2008
- X-ray imaging apparatus and method of generating stereoscopic image2US 9,414,788 B2Samsung Electronics Co., Ltd. · 2016