G01N 2223/105
Molecular or atomic beams
Official title: molecular or atomic beams
G01N2223/105 (Molecular or atomic beams) appears on 5 US grants and 4 published applications in this corpus.
Search patents in G01N- Granted patents
- 5
- Published applications
- 4
- Assignees
- 8
- Inventors
- 20
- Latest grant
- 24 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 1 |
| 2015 | 2 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 1 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
| 2025 | 0 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Device for analysing surfaces using fast atom diffraction in a high-pressure environment24 Mar 2026US 12,584,872 B2Centre National De Recherche Scientifique
- Neutral atom imaging system14 Jul 2020US 10,714,307 B2KLA-Tencor Corporation
- Composite charged particle beam apparatus5 May 2015US 9,024,280 B2Hitachi High-Tech Science Corporation
- Ion group irradiation device and secondary ion mass spectrometer24 Feb 2015US 8,963,078 B2Canon Kabushiki Kaisha
- Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles12 Jul 1983US 4,393,311 ABell Telephone Laboratories, Incorporated
- Device for analysing surfaces using fast atom diffraction in a high-pressure environment15 Aug 2024US 2024/0272098 A1Centre National De La Recherche Scientifique
- Neutral Atom Imaging System12 Dec 2019US 2019/0378684 A1KLA-Tencor Corporation
- Ion group irradiation device and secondary ion mass spectrometer25 Dec 2014US 2014/0374587 A1Canon Kabushiki Kaisha
- Composite charged particle beam apparatus28 Mar 2013US 2013/0075606 A1Hitachi High-Tech Science Corporation
Most cited
By later US patents