Device for analysing surfaces using fast atom diffraction in a high-pressure environment

A device for characterizing a surface of a sample comprising:

• a chamber comprising a support for said sample, said chamber being connected to a primary pump adapted to maintain a pressure of less than 10-2 mbar within said chamber;
• a source for generating an incident beam of neutral molecules or atoms having an energy of between 50 eV and 5 keV, with a divergence of less than or equal to 0.05°, said source being arranged to direct said incident beam within said chamber via an inlet and towards said surface to be characterized with an angle of incidence of less than or equal to 10° relative to the plane of said surface, the neutral molecules or atoms of said incident beam, forwardly scattered by said surface, forming a diffracted beam;
• and
• a detection enclosure connected to said chamber and connected to a so-called UHVP pump comprising:
• a set of concentric tubes, each tube having an inlet end with an opening, said set comprising a smaller radius tube, having length L;
• a position-sensitive detector adapted to detect a diffraction pattern of neutral molecules or atoms of said diffracted beam;
• said length L and said openings being adapted to transport said diffracted beam to the detector without losing information on said surface, said openings and said UHVP pump being adapted to maintain a pressure of less than 10-5 mbar within the detection enclosure.