G01N 2201/112
Grating pulse time encoder
G01N2201/112 (Grating pulse time encoder) appears on 6 US grants and 0 published applications in this corpus.
Search patents in G01N- Granted patents
- 6
- Published applications
- 0
- Assignees
- 4
- Inventors
- 15
- Latest grant
- 29 Sep 2009
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 3 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method of condensed cell slide preparation and detection of rarely occurring cells on microscope slides29 Sep 2009US 7,595,874 B1Sciperio, Inc
- Particle detection on patterned wafers and the like6 Feb 1990US 4,898,471 ATencor Instruments
- Dual beam laser inspection apparatus17 Feb 1987US 4,643,569 ALincoln Laser Company
- Light collector for optical contaminant and flaw detector22 Jul 1986US 4,601,576 ATencor Instruments
- Scanning sample, signal generation, data digitizing and retiming system15 Jul 1986US 4,600,951 AAT&T Technologies, Inc.
No published applications in this class yet.
Most cited
By later US patents
- Particle detection on patterned wafers and the like173US 4,898,471 ATencor Instruments · 1990
- Light collector for optical contaminant and flaw detector93US 4,601,576 ATencor Instruments · 1986
- Dual collector optical flaw detector42US 4,597,665 ATencor Instruments · 1986
- Scanning sample, signal generation, data digitizing and retiming system13US 4,600,951 AAT&T Technologies, Inc. · 1986
- Dual beam laser inspection apparatus13US 4,643,569 ALincoln Laser Company · 1987