G01N 2201/0634
Diffuse illumination
G01N2201/0634 (Diffuse illumination) appears on 172 US grants and 217 published applications in this corpus.
Search patents in G01N- Granted patents
- 172
- Published applications
- 217
- Assignees
- 170
- Inventors
- 502
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 2 | 0 |
| 2002 | 3 | 1 |
| 2003 | 0 | 0 |
| 2004 | 0 | 6 |
| 2005 | 2 | 5 |
| 2006 | 6 | 4 |
| 2007 | 4 | 6 |
| 2008 | 2 | 4 |
| 2009 | 4 | 5 |
| 2010 | 4 | 4 |
| 2011 | 1 | 4 |
| 2012 | 4 | 4 |
| 2013 | 3 | 7 |
| 2014 | 6 | 4 |
| 2015 | 5 | 10 |
| 2016 | 4 | 8 |
| 2017 | 9 | 7 |
| 2018 | 9 | 7 |
| 2019 | 12 | 23 |
| 2020 | 12 | 13 |
| 2021 | 8 | 10 |
| 2022 | 12 | 16 |
| 2023 | 10 | 26 |
| 2024 | 18 | 19 |
| 2025 | 19 | 15 |
| 2026 | 12 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and apparatus for determining a force applied to a sample during an optical interrogation technique29 Sep 2026US 12,748,046 B2Thermo Electron Scientific Instruments LLC
- Apparatus for detecting surface defects in objects1 Sep 2026US 12,723,992 B2Utpvision S.R.L.
- Snapshot hyperspectral imager for emission and reactions (SHEAR)14 Jul 2026US 12,682,479 B2The Johns Hopkins University
- Metrology apparatus and metrology methods based on high harmonic generation from a diffractive structure23 Jun 2026US 12,663,370 B2ASML Netherlands B. V.
- Optical absorption spectrometer16 Jun 2026US 12,656,247 B2ams International AG
- All-Reflective Optical Imaging Spectrometer with Flat Dispersive Element8 Oct 2026US 2026/0309620 A1
- Metrology apparatus and metrology methods based on high harmonic generation from a diffractive structure1 Oct 2026US 2026/0298820 A1ASML Netherlands B. V.
- Hyper-throughput, multiplex, single molecule imaging platform6 Aug 2026US 2026/0227615 A1University of Pittsburgh—Of the Commonwealth System of Higher Education
- Slow-light Prism Enhanced Spectroscopy (SLOPES)2 Jul 2026US 2026/0185936 A1The Texas A&M University System
- Damage detection apparatus, system, and method2 Jul 2026US 2026/0185944 A1
Most cited
By later US patents
- Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected106US 5,774,222 AHitachi, Ltd. · 1998
- Systems and/or devices for camera-based inspections86US 8,374,498 B2Microscan Systems, Inc. · 2013
- Array imaging system84US 7,135,667 B2Applera Corporation · 2006
- System for identifying defects in a composite structure66US 6,871,684 B2The Boeing Company · 2005
- System and method for imaging sub-surface polarization-sensitive material structures57US 7,289,211 B12007