Apparatus for detecting surface defects in objects
AssigneeUtpvision S.R.L.
InventorsRoberto Finazzi, Sergio Sigala
Life of this patent
Estimating the term…
Abstract
An apparatus for detecting surface defects in objects comprises one or more illuminating devices configured to emit at least a light radiation and illuminate an object to be inspected. The detection apparatus is further configured to measure the light radiation received by the object, and also comprises one or more image acquisition devices configured to acquire one or more images of the object, when illuminated by the illuminating device, and a data processor configured to process the images acquired by the image acquisition device and provide detection data indicative of the presence of surface defects on the object.
Claims20
An apparatus for detecting surface defects in objects, the apparatus comprising:
- one or more illumination devices configured to emit at least a light radiation along at least an optical axis and illuminate an object to be inspected;
- a measuring device configured to measure the light radiation received by the object, and comprising at least a platelike body arranged to intersect the optical axis and receive the light radiation with which the one or more illuminating devices illuminate the object,
- wherein the platelike body comprises a plate of optically active material capable of deflecting, along an extension plane of the plate, a predetermined portion of the light radiation received from the one or more illumination devices, and
- wherein the plate of optically active material comprises particulate scatterers dispersed therein, the particulate scatterers being configured to deflect the predetermined portion of the light radiation along the extension plane of the plate,
- the measuring device further comprising at least a light sensor optically coupled to the at least a platelike body and configured to receive the portion of light radiation deflected by the plate and provide detection signals indicative of a light intensity of the light radiation so received.
An object inspection station comprising:
- a detection apparatus for detecting surface defects in objects, the apparatus comprising:
- one or more illumination devices configured to emit at least a light radiation along at least an optical axis and illuminate an object to be inspected;
- a measuring device configured to measure the light radiation received by the object, and comprising at least a platelike body arranged to intersect the optical axis and receive the light radiation with which the one or more illuminating devices illuminate the object,
- wherein the platelike body comprises a plate of optically active material capable of deflecting, along an extension plane of the plate, a predetermined portion of the light radiation received from the one or more illumination devices, and
- wherein the plate of optically active material comprises particulate scatterers dispersed therein, the particulate scatterers being configured to deflect the predetermined portion of the light radiation along the extension plane of the plate,
- the measuring device further comprising at least a light sensor optically coupled to the at least a platelike body and configured to receive the portion of light radiation deflected by the plate and provide detection signals indicative of a light intensity of the light radiation so received.
Dependencies are inferred from the claim text.