Damage detection apparatus, system, and method

A damage detection system comprising:

• one or more damage detection apparatuses configured to detect damage on an object, wherein each of the one or more damage detection apparatuses is comprised of lighting configured to produce light having wavelengths in the range of 700-1000 nanometers and one or more cameras configured to capture light having wavelengths in the range of 700-1000 nanometers;
• and
• a computing device communicatively connected to the one or more cameras of the damage detection apparatuses;
• wherein the one or more damage detection apparatuses are positioned to project light onto one or more surfaces of an object, wherein the one or more cameras are configured to capture light reflecting off of the object, and wherein the computing device is configured to process images captured by the one or more cameras to locate one or more locations of damage on the object.

A method to detect damage to an object comprising:

• utilizing one or more damage detection apparatuses comprised of lighting configured to produce light having wavelengths in the range of 700-1000 nanometers and one or more cameras configured to capture light having wavelengths in the range of 700-1000 nanometers;
• placing an object to be analyzed for damage near the one or more damage detection apparatuses;
• projecting light onto the object from the lighting of the one or more damage detection apparatuses;
• capturing light reflected of the object with the one or more cameras of the one or more damage detection apparatuses;
• and
• analyzing the captured light to determine locations of damage on the object.