G01N 2201/025
Mechanical control of operations
G01N2201/025 (Mechanical control of operations) appears on 88 US grants and 112 published applications in this corpus.
Search patents in G01N- Granted patents
- 88
- Published applications
- 112
- Assignees
- 83
- Inventors
- 313
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 3 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 1 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 2 |
| 2011 | 3 | 1 |
| 2012 | 0 | 2 |
| 2013 | 1 | 0 |
| 2014 | 1 | 5 |
| 2015 | 3 | 24 |
| 2016 | 7 | 10 |
| 2017 | 12 | 5 |
| 2018 | 10 | 4 |
| 2019 | 4 | 6 |
| 2020 | 4 | 6 |
| 2021 | 4 | 4 |
| 2022 | 8 | 2 |
| 2023 | 1 | 5 |
| 2024 | 3 | 11 |
| 2025 | 9 | 10 |
| 2026 | 9 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Tilt and focusing adjustment for consistent gem imaging6 Oct 2026US 12,754,140 B2Gemological Institute of America, Inc. (GIA)
- Pose change apparatus and inspection method4 Aug 2026US 12,699,040 B2Hitachi Astemo, Ltd.
- Light source apparatus, inspection apparatus, exposure apparatus, light source control method, inspection method, and exposure method28 Jul 2026US 12,693,232 B2Lasertec Corporation
- Metrology integrated with vacuum processing5 May 2026US 12,622,210 B2Tokyo Electron Limited
- Magnetic stabilization method and system in infrared, visible and ultraviolet spectroscopy21 Apr 2026US 12,607,553 B2Servomex Group Limited
- Detection device and detection method for detecting appearance of battery module8 Oct 2026US 2026/0312157 A1Contemporary Amperex Technology Co., Limited
- In-vacuum integrated metrology sensor for thin film deposition and etching applications27 Aug 2026US 2026/0255915 A1Tokyo Electron Limited
- Method for inspecting semiconductor device and system thereof23 Jul 2026US 2026/0210704 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Inspection system and control system for rejecting disturbances and attenuating disturbance-induced errors therein25 Jun 2026US 2026/0177496 A1Applied Materials Israel Ltd.
- Inspection system and inspection module11 Jun 2026US 2026/0160702 A1Wnc Corporation
Most cited
By later US patents
- Measuring apparatus199US 5,316,727 ATerumo Kabushiki Kaisha · 1994
- Portable appearance measuring apparatus73US 5,377,000 AColor and Appearance Technology, Inc. · 1994
- Coded cuvette for use in testing apparatus62US 5,098,661 AMedical Laboratory Automation, Inc. · 1992
- Instrument for quantitative analysis61US 5,223,218 AMeidensha Corporation · 1993
- Cuvette and apparatus for performing biological assays46US 5,100,238 AOrlon Corporation · 1992