G01N 2021/933
Adjusting baseline or gain
Official title: {Adjusting baseline or gain (also for web inspection)}
G01N2021/933 (Adjusting baseline or gain) appears on 13 US grants and 10 published applications in this corpus.
Search patents in G01N- Granted patents
- 13
- Published applications
- 10
- Assignees
- 9
- Inventors
- 24
- Latest grant
- 11 Mar 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 2 |
| 2020 | 0 | 1 |
| 2021 | 1 | 2 |
| 2022 | 2 | 3 |
| 2023 | 3 | 0 |
| 2024 | 2 | 1 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Optical device11 Mar 2025US 12,247,915 B2Asahi Kasei Microdevices Corporation
- Measure of the degree of crystallinty of a polymer coating on a metal substrate29 Oct 2024US 12,130,231 B2ArcelorMittal
- Optical device5 Mar 2024US 11,921,038 B2Asahi Kasei Microdevices Corporation
- System and method for material characterization24 Oct 2023US 11,796,479 B2Southern Innovation International Pty Ltd
- Alignment of a specimen for inspection and other processes5 Sep 2023US 11,748,871 B2KLA Corporation
- Optical device16 May 2024US 2024/0159662 A1Asahi Kasei Microdevices Corporation
- Optical device4 Aug 2022US 2022/0244174 A1Asahi Kasei Microdevices Corporation
- Alignment of a Specimen for Inspection and Other Processes31 Mar 2022US 2022/0101506 A1KLA Corporation
- Measure of the degree of crystallinty of a polymer coating on a metal substrate20 Jan 2022US 2022/0018767 A1ArcelorMittal
- System and method for material characterization1 Jul 2021US 2021/0199592 A1Southern Innovation International Pty Ltd
Most cited
By later US patents
- Flaw detector for detecting flaws in a sheet25US 4,724,481 AFutec Inc. · 1988
- Light scanner web profile measurement apparatus and method15US 5,073,712 AABB Process Automation Inc. · 1991
- Roll mark inspection apparatus8US 4,958,307 AKabushiki Kaisha Toshiba · 1990
- System and method for material characterization4US 10,962,485 B2Southern Innovation International Pty Ltd · 2021
- System and method for material characterization4US 11,243,327 B2Southern Innovation International Pty Ltd · 2022