G01N 2021/8896
Circuits specially adapted for system specific signal conditioning
Official title: {Circuits specially adapted for system specific signal conditioning}
G01N2021/8896 (Circuits specially adapted for system specific signal conditioning) appears on 101 US grants and 95 published applications in this corpus.
Search patents in G01N- Granted patents
- 101
- Published applications
- 95
- Assignees
- 74
- Inventors
- 239
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 2 | 0 |
| 1991 | 3 | 0 |
| 1992 | 2 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 2 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 3 |
| 2004 | 1 | 2 |
| 2005 | 1 | 3 |
| 2006 | 3 | 12 |
| 2007 | 2 | 3 |
| 2008 | 2 | 5 |
| 2009 | 4 | 4 |
| 2010 | 4 | 5 |
| 2011 | 3 | 3 |
| 2012 | 8 | 3 |
| 2013 | 7 | 5 |
| 2014 | 1 | 1 |
| 2015 | 3 | 7 |
| 2016 | 7 | 4 |
| 2017 | 0 | 1 |
| 2018 | 7 | 7 |
| 2019 | 1 | 4 |
| 2020 | 5 | 4 |
| 2021 | 3 | 2 |
| 2022 | 4 | 1 |
| 2023 | 3 | 4 |
| 2024 | 1 | 2 |
| 2025 | 7 | 4 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Pixel deviations28 Jul 2026US 12,693,233 B2Hewlett-Packard Development Company, L. P.
- Imaging device, inspection device, and imaging method26 May 2026US 12,638,403 B2Kabushiki Kaisha N-Tech
- Method and system for performing multi-element analysis in real-time using multi-element concentration sensor19 May 2026US 12,631,564 B1Mapana Inc.
- Crack detection device, crack detection method and computer readable medium14 Oct 2025US 12,442,773 B2Mitsubishi Electric Corporation
- Optical in-situ inspection system7 Oct 2025US 12,435,642 B2Rtx Corporation
- Method And System For Performing Multi-Element Analysis In Real-Time Using Multi-Element Concentration Sensor20 Aug 2026US 2026/0243689 A1Mapana Inc.
- Measuring apparatus, measuring method, and carrier medium9 Jul 2026US 2026/0194471 A1Ricoh Company, Ltd.
- Anti-aliaising for optical inspection system28 May 2026US 2026/0146957 A1Applied Materials Israel Ltd.
- Pixel deviations16 Apr 2026US 2026/0104363 A1Hewlett-Packard Development Company, L. P.
- Optical in-situ inspection system8 Jan 2026US 2026/0009341 A1Rtx Corporation
Most cited
By later US patents
- Method of analyzing visual inspection image data to find defects on a device98US 6,330,354 B1International Business Machines Corporation · 2001
- Method and apparatus for detecting patterns52US 5,153,444 AHitachi, Ltd. · 1992
- TDI sensor in a darkfield system49US 9,891,177 B2KLA-Tencor Corporation · 2018
- Method and system using exposure control to inspect a surface43US 6,724,473 B2KLA-Tencor Technologies Corporation · 2004
- Defect detection system and method for pattern to be inspected utilizing multiple-focus image signals40US 5,038,048 AHitachi, Ltd. · 1991