G01N 2021/4792
Polarisation of scatter light
Official title: {Polarisation of scatter light}
G01N2021/4792 (Polarisation of scatter light) appears on 205 US grants and 221 published applications in this corpus.
Search patents in G01N- Granted patents
- 205
- Published applications
- 221
- Assignees
- 143
- Inventors
- 487
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 6 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 3 |
| 2005 | 2 | 5 |
| 2006 | 3 | 19 |
| 2007 | 2 | 12 |
| 2008 | 9 | 7 |
| 2009 | 13 | 5 |
| 2010 | 8 | 16 |
| 2011 | 9 | 11 |
| 2012 | 7 | 3 |
| 2013 | 7 | 7 |
| 2014 | 4 | 4 |
| 2015 | 7 | 11 |
| 2016 | 9 | 9 |
| 2017 | 7 | 12 |
| 2018 | 10 | 17 |
| 2019 | 19 | 10 |
| 2020 | 15 | 13 |
| 2021 | 14 | 17 |
| 2022 | 7 | 9 |
| 2023 | 6 | 9 |
| 2024 | 9 | 11 |
| 2025 | 11 | 5 |
| 2026 | 2 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and system for optical characterization of patterned samples22 Sep 2026US 12,742,724 B2Nova Ltd.
- Hybrid systems and methods for characterizing stress in chemically strengthened transparent substrates21 Apr 2026US 12,607,560 B2Corning Incorporated
- Generation of subsurface scattering texture maps for 3D objects23 Dec 2025US 12,505,606 B2Sony Corporation of America
- Method and apparatus for coherent spread spectrum optical spectroscopy9 Dec 2025US 12,492,984 B2Ciena Corporation
- Photonic integrated circuit and characterization method9 Dec 2025US 12,493,000 B2University of Rochester
- Road surface condition detection apparatus and method for operating thereof30 Jul 2026US 2026/0219199 A1
- Fusion optical measurement device16 Jul 2026US 2026/0202337 A1Korea Research Institute of Standards and Science
- Method and Apparatus for Measuring Polarization Scattering Model Parameters Based on Monte Carlo Approach18 Jun 2026US 2026/0168925 A1Beijing Institute of Technology
- Inspection device, inspection method, and inspection program5 Feb 2026US 2026/0036517 A1Horiba, Ltd.
- Smoke detector light source and sensor to emit and detect polarized light5 Feb 2026US 2026/0038353 A1Microchip Technology Incorporated
Most cited
By later US patents
- Measurements of substances using two different propagation modes of light through a common optical path174US 6,903,820 B2Tomophase Corporation · 2005
- Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern97US 5,486,919 ACanon Kabushiki Kaisha · 1996
- Measuring an alignment target with a single polarization state87US 6,992,764 B1Nanometrics Incorporated · 2006
- Measurements of optical inhomogeneity and other properties in substances using propagation modes of light85US 7,999,938 B2Tomophase Corporation · 2011
- Polarization-sensitive common path optical coherence reflectometry/tomography device84US 7,728,985 B2Imalux Corporation · 2010