Method and Apparatus for Measuring Polarization Scattering Model Parameters Based on Monte Carlo Approach

A network device, comprising:

• a processor, a memory, and a program stored in the memory and executable on the processor, wherein the program, when executed by the processor, implements the following steps:
• simulating a multiple scattering process of polarized light during diffuse reflection based on a Monte Carlo approach to obtain a first functional relationship between a depolarization coefficient of the polarized light and a scattering distance of the polarized light within a material;
• establishing a function curve between depolarization coefficients and scattering coefficients based on second functional relationships between the scattering coefficient and the scattering distance and the first functional relationships of different materials;
• fitting the function curve to a pre-constructed initial model to generate a polarization scattering model;
• and
• optimizing polarization parameters and intensity parameters in the polarization scattering model to obtain an optimized polarization scattering model.

A non-transitory readable storage medium storing a program, wherein the program, when executed by a processor, implements the following steps:

• simulating a multiple scattering process of polarized light during diffuse reflection based on a Monte Carlo approach to obtain a first functional relationship between a depolarization coefficient of the polarized light and a scattering distance of the polarized light within a material;
• establishing a function curve between depolarization coefficients and scattering coefficients based on second functional relationships between the scattering coefficient and the scattering distance and the first functional relationships of different materials;
• fitting the function curve to a pre-constructed initial model to generate a polarization scattering model;
• and
• optimizing polarization parameters and intensity parameters in the polarization scattering model to obtain an optimized polarization scattering model.