G01N 2021/4783
Examining under varying incidence
Official title: {Examining under varying incidence; Angularly adjustable head}
G01N2021/4783 (Examining under varying incidence) appears on 17 US grants and 20 published applications in this corpus.
Search patents in G01N- Granted patents
- 17
- Published applications
- 20
- Assignees
- 20
- Inventors
- 46
- Latest grant
- 21 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 1 | 2 |
| 2013 | 0 | 0 |
| 2014 | 0 | 2 |
| 2015 | 0 | 1 |
| 2016 | 0 | 3 |
| 2017 | 2 | 0 |
| 2018 | 3 | 2 |
| 2019 | 1 | 2 |
| 2020 | 2 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 2 |
| 2024 | 0 | 4 |
| 2025 | 3 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Edge portion measuring apparatus and method for measuring edge portion21 Oct 2025US 12,449,378 B2Shin-Etsu Handotai Co., Ltd.
- Measuring apparatus and method for roughness and/or defect measurement on a surface22 Jul 2025US 12,366,445 B2ASML Netherlands B. V.
- Phase retrieval22 Jul 2025US 12,366,525 B2Applied Materials Israel Ltd.
- Portable device for measuring the geometry of an object and its spatially varying surface reflectance on site1 Sep 2020US 10,764,482 B2Ceske Vysoke Uceni Technicke V Praze Jugoslavskych Partyzanu
- Apparatus and method for measuring biological component24 Mar 2020US 10,595,757 B2Samsung Electronics Co., Ltd.
- Imaging Using Reflected Illuminated Structures12 Feb 2026US 2026/0043740 A1
- Phase retrieval11 Jul 2024US 2024/0230530 A9Applied Materials Israel Ltd.
- Measuring apparatus and method for roughness and/or defect measurement on a surface6 Jun 2024US 2024/0183655 A1ASML Netherlands B. V.
- Method and apparatus for inspecting lacquered surfaces with effect pigments6 Jun 2024US 2024/0183788 A1BYK Gardner GmbH
- Phase retrieval25 Apr 2024US 2024/0133807 A1Applied Materials Israel Ltd.
Most cited
By later US patents
- System for 3-D inspection of objects102US 5,118,192 ARobotic Vision Systems, Inc. · 1992
- Surface inspection apparatus and method21US 5,225,890 AGenCorp Inc. · 1993
- Flow cytometer17US 5,135,302 AOMRON Corporation · 1992
- Hand-held measurement device for capturing the visual impression of a measurement object12US 9,772,230 B2X-Rite Switzerland GmbH · 2017
- Method and device for measuring optical characteristic variables of transparent, scattering measurement objects4US 8,259,294 B2Von Ardenne Anlagentechnik GmbH · 2012