G01N 2021/456
Moire deflectometry
Official title: {Moire deflectometry}
G01N2021/456 (Moire deflectometry) appears on 8 US grants and 9 published applications in this corpus.
Search patents in G01N- Granted patents
- 8
- Published applications
- 9
- Assignees
- 12
- Inventors
- 25
- Latest grant
- 7 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 0 | 1 |
| 2020 | 1 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 3 |
| 2023 | 0 | 2 |
| 2024 | 2 | 0 |
| 2025 | 2 | 0 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Method and a system for assessing and optionally monitoring or controlling the texture of a surface7 Jul 2026US 12,675,894 B2BASF Coatings GmbH
- Method and system for moiré profilimetry using simultaneous dual fringe projection18 Nov 2025US 12,474,266 B2Centro De Investigaciones En Optica A.C.
- Pore measurement device29 Apr 2025US 12,287,287 B2The Regents of the University of California
- Optical component for an ATR imaging device24 Sep 2024US 12,099,008 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Deflectometry measurement system4 Jun 2024US 12,000,752 B2Lambda-X Ophthalmics
- A method and a system for assessing and optionally monitoring or controlling the texture of a surface28 Dec 2023US 2023/0419516 A1BASF Coatings GmbH
- Method and system for moiré profilimetry using simultaneous dual fringe projection23 Mar 2023US 2023/0091424 A1Centro De Investigaciones En Optica A.C.
- Pore measurement device22 Dec 2022US 2022/0404276 A1The Regents of the University of California
- Optical component for an atr imaging device23 Jun 2022US 2022/0196895 A1Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Deflectometry Measurement System16 Jun 2022US 2022/0187161 A1Lambda-X
Most cited
By later US patents
- Methods and apparatus for laser scanning structured illumination microscopy and tomography21US 9,360,660 B2Northwestern University · 2016
- Three-dimensional shape, displacement, and strain measurement device and method using periodic pattern, and program therefor1US 10,655,954 B2National Institute of Advanced Industrial Science and Technology · 2020