Lambda-X
Nivelles, BE· latest recorded location
LAMBDA-X is named on 3 US grants and 4 published applications in this corpus. Its most frequent classification is G01M (Testing static or dynamic balance of machines or structures).
- Granted patents
- 3
- Published applications
- 4
- Inventors
- 5
- Granted in 2026 so far
- 0
- Most recent grant
- 17 May 2022
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 1 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 1 | 1 |
| 2023 | 0 | 1 |
By publication year.
Technology areas
Share of 7 documents
- G01MTesting static or dynamic balance of machines or structures4
- G01NInvestigating or analysing materials by determining their chemical or physical properties3
- G01BMeasuring length, thickness or similar linear dimensions2
- G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of2
- G02BOptical elements, systems or apparatus1
- G02CSpectacles1
- G02FOptical devices or arrangements for the control of light by modification of1
Recent patents
- Instrument for measuring, controlling, and testing optical lenses17 May 2022US D952,158 S1Design
- Hyperspectral imaging6 Jun 2017US 9,671,287 B2
- Fourier transform deflectometry system and method16 Apr 2013US 8,422,822 B2
- Method, device, computer program and system for conversion of a measurement of an ophthalmic lens28 Dec 2023US 2023/0417626 A1
- Deflectometry Measurement System16 Jun 2022US 2022/0187161 A1
- Hyperspectral imaging10 Dec 2015US 2015/0355027 A1
- Fourier transform deflectometry system and method9 Dec 2010US 2010/0310130 A1
Most cited
By later US patents