G01B 9/02039
By matching the wavefront with a particular object surface shape
Official title: {by matching the wavefront with a particular object surface shape}
G01B9/02039 (By matching the wavefront with a particular object surface shape) appears on 155 US grants and 135 published applications in this corpus.
Search patents in G01B- Granted patents
- 155
- Published applications
- 135
- Assignees
- 62
- Inventors
- 234
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 4 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 3 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 3 | 0 |
| 2000 | 0 | 0 |
| 2001 | 4 | 1 |
| 2002 | 2 | 3 |
| 2003 | 1 | 12 |
| 2004 | 8 | 6 |
| 2005 | 8 | 5 |
| 2006 | 8 | 7 |
| 2007 | 3 | 3 |
| 2008 | 7 | 3 |
| 2009 | 6 | 5 |
| 2010 | 3 | 13 |
| 2011 | 5 | 7 |
| 2012 | 11 | 7 |
| 2013 | 10 | 4 |
| 2014 | 6 | 6 |
| 2015 | 7 | 5 |
| 2016 | 4 | 7 |
| 2017 | 0 | 0 |
| 2018 | 3 | 3 |
| 2019 | 3 | 4 |
| 2020 | 4 | 4 |
| 2021 | 5 | 5 |
| 2022 | 3 | 11 |
| 2023 | 1 | 4 |
| 2024 | 7 | 6 |
| 2025 | 8 | 4 |
| 2026 | 3 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Measuring device for interferometrically measuring a surface form5 May 2026US 12,618,664 B2Carl Zeiss SMT GmbH
- Measuring device for interferometric shape measurement10 Mar 2026US 12,571,985 B2Carl Zeiss SMT GmbH
- Method for determining a position of a mirror6 Jan 2026US 12,516,963 B2Carl Zeiss SMT GmbH
- Single frame-tilted wave interferometer28 Oct 2025US 12,455,157 B2Universität Stuttgart
- Production method and measurement method2 Sep 2025US 12,405,108 B2Carl Zeiss SMT GmbH
- Method for the interferometric determination of the surface shape of a test object18 Dec 2025US 2025/0383198 A1Carl Zeiss SMT GmbH
- Measurement apparatus, measurement method, and manufacturing method21 Aug 2025US 2025/0264322 A1Canon Kabushiki Kaisha
- System and method for interferometric measurement alignment17 Apr 2025US 2025/0123094 A1
- Inferometric measuring apparatus23 Jan 2025US 2025/0027764 A1Carl Zeiss SMT GmbH
- Systems and methods for measurement of optical workpieces17 Oct 2024US 2024/0341587 A1Arizona Optical Metrology LLC
Most cited
By later US patents
- Method and apparatus for white-light dispersed-fringe interferometric measurement of corneal topography177US 5,317,389 ACalifornia Institute of Technology · 1994
- Interferometric optical systems having simultaneously scanned optical path length and focus101US 7,012,700 B2Zygo Corporation · 2006
- Infrared scanning interferometry apparatus and method90US 6,195,168 B1Zygo Corporation · 2001
- Method of manufacturing an optical system73US 6,312,373 B1Nikon Corporation · 2001
- Grazing incidence interferometer and method72US 6,249,351 B1Zygo Corporation · 2001