G01B 9/02019
Contacting different points on same face of object
Official title: {contacting different points on same face of object}
G01B9/02019 (Contacting different points on same face of object) appears on 201 US grants and 179 published applications in this corpus.
Search patents in G01B- Granted patents
- 201
- Published applications
- 179
- Assignees
- 121
- Inventors
- 398
- Latest grant
- 4 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 4 | 0 |
| 1989 | 7 | 0 |
| 1990 | 2 | 0 |
| 1991 | 3 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 3 | 0 |
| 1995 | 6 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 3 | 0 |
| 2000 | 3 | 0 |
| 2001 | 3 | 1 |
| 2002 | 0 | 2 |
| 2003 | 7 | 17 |
| 2004 | 6 | 8 |
| 2005 | 8 | 17 |
| 2006 | 9 | 8 |
| 2007 | 14 | 6 |
| 2008 | 11 | 8 |
| 2009 | 15 | 3 |
| 2010 | 1 | 2 |
| 2011 | 1 | 7 |
| 2012 | 2 | 8 |
| 2013 | 3 | 1 |
| 2014 | 4 | 5 |
| 2015 | 8 | 5 |
| 2016 | 6 | 7 |
| 2017 | 5 | 8 |
| 2018 | 8 | 4 |
| 2019 | 10 | 12 |
| 2020 | 5 | 10 |
| 2021 | 10 | 5 |
| 2022 | 7 | 13 |
| 2023 | 6 | 9 |
| 2024 | 3 | 3 |
| 2025 | 8 | 6 |
| 2026 | 0 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Hybrid displacement measuring device19 Aug 2025US 12,392,599 B1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
- Stage device, lithography apparatus, and article manufacturing method12 Aug 2025US 12,386,274 B2Canon Kabushiki Kaisha
- Parallel optical coherence tomography system using an integrated photonic device4 Jun 2026US 2026/0153324 A1
- Method for measuring at least one cross-sectional dimension of a cylindrical hollow body2 Apr 2026US 2026/0092772 A1Schott AG
- Dual self-mixing interferometry device and method29 Jan 2026US 2026/0029531 A1ams-OSRAM Asia Pacific Pte. Ltd.
- Measuring module for determining the position of a component in an optical system for microlithography8 Jan 2026US 2026/0010080 A1
- An interferometer for tear film measurement with sub-micron resolution30 Oct 2025US 2025/0334392 A1The UAB Research Foundation
Most cited
By later US patents
- Method and apparatus for optical imaging with means for controlling the longitudinal range of the sample1,199US 5,321,501 AMassachusetts Institute of Technology · 1994
- Method and apparatus for performing optical measurements1,018US 5,459,570 AMassachusetts Institute of Technology · 1995
- Method and apparatus for acquiring images using a ccd detector array and no transverse scanner522US 5,465,147 AMassachusetts Institute of Technology · 1995
- Differential interferometer system and lithographic step-and-scan apparatus provided with such a system426US 6,046,792 AU. S. Philips Corporation · 2000
- System and method for optically measuring a structure261US 5,880,838 ACalifornia Institute of California · 1999