Interferometer displacement measurement system and method
AssigneesBeijing U-Precision Tech Co., Ltd., Beijing United Victory Precision Technology Co., Ltd.
InventorsGuohua Sun, Xiaoliang Gao, Lei Xu
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AssigneesBeijing U-Precision Tech Co., Ltd., Beijing United Victory Precision Technology Co., Ltd.
InventorsGuohua Sun, Xiaoliang Gao, Lei Xu
Estimating the term…
Interferometer displacement measurement system and method are disclosed, wherein, a measurement light is processed by a first polarization splitting prism, a first ¼ wave plate, a first splitting prism, an optical waveguide component and a reflector, and then is returned to a first photoeletric detector and a second photoeletric detector. The reference light is processed by a second polarization splitting prism, a second ¼ wave plate, a second splitting prism and a reflecting mirror, and then is returned to the first photoeletric detector and the second photoeletric detector. The first photoeletric detector forms a measurement signal according to the processed measurement light and the processed reference light, and the second photoeletric detector forms a reference signal according to the processed measurement light and the processed reference light. Displacement information of the object to be detected is determined according to the measurement signal and the reference signal.
An interferometer displacement measurement system comprising:
Dependencies are inferred from the claim text.