G01B 9/02016
Contacting two or more objects
Official title: {contacting two or more objects}
G01B9/02016 (Contacting two or more objects) appears on 31 US grants and 35 published applications in this corpus.
Search patents in G01B- Granted patents
- 31
- Published applications
- 35
- Assignees
- 32
- Inventors
- 88
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 2 |
| 2007 | 1 | 1 |
| 2008 | 1 | 2 |
| 2009 | 0 | 0 |
| 2010 | 1 | 1 |
| 2011 | 1 | 3 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 4 |
| 2015 | 1 | 2 |
| 2016 | 3 | 1 |
| 2017 | 1 | 1 |
| 2018 | 4 | 3 |
| 2019 | 1 | 2 |
| 2020 | 3 | 2 |
| 2021 | 2 | 2 |
| 2022 | 1 | 0 |
| 2023 | 1 | 3 |
| 2024 | 0 | 1 |
| 2025 | 4 | 4 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Low-bulk interferometric sensor11 Aug 2026US 12,704,369 B2Sciences Et Techniques Industrielles De La Lumiere
- Measurement method and measurement apparatus for measuring thickness of semiconductor wafer11 Nov 2025US 12,467,741 B2santec Holdings Corporation
- Optical interference measurement apparatus having optical path lengths set to satisfy a given relation20 May 2025US 12,306,343 B2OMRON Corporation
- Method and system for determining the position of an element of an optical system in an assembly for processing or measuring an object, as well as the position of said object relative to said assembly, by parallel interferometric measurements13 May 2025US 12,298,131 B2ADIGE S.p.A.
- Optical measurement system14 Jan 2025US 12,196,550 B2National Cheng Kung University
- Device for carrying out an optical coherence tomography10 Sep 2026US 2026/0266588 A1Heidelberg Engineering GmbH
- Method to determine an absolute position of a movable object, interferometer system, projection system and lithograpic apparatus23 Oct 2025US 2025/0327653 A1ASML Netherlands B. V.
- Low-Bulk Interferometric Sensor9 Oct 2025US 2025/0314475 A1Sciences Et Techniques Industrielles De La Lumiere
- Non-contact optical metrology system to measure simultaneously the relative piston and the relative inclination in two axes (tip and tilt) between two reflective surfaces12 Jun 2025US 2025/0189296 A1Idom, S.A.U.
- Measuring parallelism13 Feb 2025US 2025/0052559 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Differential displacement measuring interferometer52US 5,187,543 AZygo Corporation · 1993
- Optical coherence tomography with multiple sample arms35US 8,711,364 B2oProbe, LLC · 2014
- Interferometer calibration methods and apparatus22US 7,212,292 B2Hewlett-Packard Development Company, L. P. · 2007
- Metrology of multi-layer stacks14US 10,591,284 B2Zygo Corporation · 2020
- Interferometer calibration methods and apparatus4US 7,110,122 B2Hewlett-Packard Development Company, L. P. · 2006