B82Y 35/00
Methods or apparatus for measurement or analysis of nanostructures
B82Y35/00 (Methods or apparatus for measurement or analysis of nanostructures) appears on 1,961 US grants and 1,537 published applications in this corpus.
Search patents in B82Y- Granted patents
- 1,961
- Published applications
- 1,537
- Assignees
- 800
- Inventors
- 3,803
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 3 | 0 |
| 1987 | 4 | 0 |
| 1988 | 5 | 0 |
| 1989 | 14 | 0 |
| 1990 | 17 | 0 |
| 1991 | 26 | 0 |
| 1992 | 38 | 0 |
| 1993 | 50 | 0 |
| 1994 | 52 | 0 |
| 1995 | 52 | 0 |
| 1996 | 46 | 0 |
| 1997 | 48 | 0 |
| 1998 | 60 | 0 |
| 1999 | 75 | 0 |
| 2000 | 49 | 0 |
| 2001 | 56 | 18 |
| 2002 | 62 | 68 |
| 2003 | 63 | 69 |
| 2004 | 72 | 74 |
| 2005 | 64 | 92 |
| 2006 | 78 | 100 |
| 2007 | 69 | 111 |
| 2008 | 74 | 101 |
| 2009 | 83 | 86 |
| 2010 | 72 | 99 |
| 2011 | 74 | 98 |
| 2012 | 73 | 77 |
| 2013 | 80 | 80 |
| 2014 | 94 | 82 |
| 2015 | 78 | 34 |
| 2016 | 50 | 31 |
| 2017 | 38 | 24 |
| 2018 | 24 | 22 |
| 2019 | 25 | 33 |
| 2020 | 19 | 31 |
| 2021 | 22 | 76 |
| 2022 | 35 | 46 |
| 2023 | 32 | 27 |
| 2024 | 43 | 26 |
| 2025 | 27 | 20 |
| 2026 | 12 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Mesoporous silica wrapped nanoparticle composite material, preparation method thereof, and use thereof18 Aug 2026US 12,709,548 B2Wuyi University
- Reagent kit, measurement kit, and measurement method21 Jul 2026US 12,687,546 B2FUJIFILM Corporation
- Pathogen detection method and apparatus7 Jul 2026US 12,674,798 B2Industry-Academic Cooperation Foundation, Yeungnam University
- System and method for scanning near-field optical microscopy23 Jun 2026US 12,663,435 B2Brown University
- Methods for lignin extraction16 Jun 2026US 12,655,297 B2Canon Virginia, Inc.
- Penetration detection sensor8 Oct 2026US 2026/0314427 A1
- Optical apparatus for three-dimensional nanostructure measurement and inspection, three-dimensional nanostructure measurement and inspection apparatus including the same, and three-dimensional nanostructure measurement and inspection method23 Jul 2026US 2026/0210870 A1Samsung Electronics Co., Ltd.
- Method and System for Determining Nanotube and/or Nanowire Lengths9 Jul 2026US 2026/0194437 A1Rutgers, The State University of New Jersey
- Physical Security and Authentication Systems Using Quantum Signatures9 Jul 2026US 2026/0194607 A1Northeastern University
- Height measurements using focus line12 Mar 2026US 2026/0074145 A1Carl Zeiss SMT GmbH
Most cited
By later US patents
- Method and apparatus for performing optical frequency domain reflectometry488US 6,160,826 AMassachusetts Institute of Technology · 2000
- Zero-mode clad waveguides for performing spectroscopy with confined effective observation volumes483US 6,917,726 B2Cornell Research Foundation, Inc. · 2005
- Method and apparatus for performing optical measurements using a rapidly frequency-tuned laser478US 5,956,355 AMassachusetts Institute of Technology · 1999
- Microfluidic systems in the electrochemical detection of target analytes254US 6,942,771 B1Clinical Micro Sensors, Inc. · 2005
- Superresolution imaging fiber for subwavelength light energy generation and near-field optical microscopy253US 5,633,972 ATrustees of Tufts College · 1997