YieldBoost Tech, Inc.
San Jose, CA, US· latest recorded location
YieldBoost Tech, Inc. is named on 12 US grants and 4 published applications in this corpus. Its most frequent classification is G02F (Optical devices or arrangements for the control of light by modification of).
- Granted patents
- 12
- Published applications
- 4
- Inventors
- 1
- Granted in 2026 so far
- 0
- Most recent grant
- 26 Dec 2006
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2004 | 0 | 4 |
| 2005 | 5 | 0 |
| 2006 | 7 | 0 |
By publication year.
Technology areas
Share of 16 documents
- G02FOptical devices or arrangements for the control of light by modification of14
- G09GArrangements or circuits for control of indicating devices using static means to3
- H04NPictorial communication2
- G05BControl or regulating systems in general1
- H10DInorganic electric semiconductor devices1
- Y02PLow-carbon manufacturing1
Recent patents
- Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same26 Dec 2006US 7,154,292 B2
- System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process20 Jun 2006US 7,064,572 B2
- System and method for detecting defects in a thin-film-transistor array30 May 2006US 7,053,645 B2
- Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same9 May 2006US 7,042,244 B2
- System and method for improving TFT-array manufacturing yields4 Apr 2006US 7,024,338 B2
- System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process5 Aug 2004US 2004/0153180 A1
- System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process5 Aug 2004US 2004/0153181 A1
- System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process5 Aug 2004US 2004/0153183 A1
- System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process5 Aug 2004US 2004/0153271 A1
Most cited
By later US patents
- System and method for detecting defects in a thin-film-transistor array5US 7,053,645 B22006
- System and method for classifying defects in and identifying process problems for an electrical circuit2US 6,982,556 B22006
- System and method for improving TFT-array manufacturing yields1US 7,024,338 B22006
- Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same1US 7,154,292 B22006