System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
AssigneeYieldBoost Tech, Inc.
InventorKyo Young Chung
Life of this patent
Estimating the term…
Abstract
A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, and optimizing production yields is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user-defined parameters, such as profit.
Claims30
A method of estimating a production quantity of electrode array panels required to achieve a predetermined monetary result in a liquid crystal display (LCD) manufacturing setup, wherein the LCD manufacturing setup comprises an array test stage and an array repair stage, comprising:
- determining, at the array test stage, a number of bad electrode array panels and a number of irreparably bad electrode array panels;
- determining, at the array repair stage, a number of the bad electrode array panels that are not reparable;
- determining a first yield parameter based on the number of irreparably bad electrode array panels at the array test stage, and the number of bad electrode array panels that are not reparable at the array repair stage;
- and
- estimating the production quantity of electrode array panels for achieving the predetermined monetary result based on the first yield parameter.
A system for estimating a production quantity of electrode array panels required to achieve a predetermined monetary result in a liquid crystal display (LCD) manufacturing setup, comprising:
- an array test stage for testing electrode array panels and determining a number of bad electrode array panels and a number of irreparably bad electrode array panels;
- an array repair stage for receiving the bad electrode array panels and determining a number of the bad electrode array panels that are not reparable;
- and
- a processor for determining a first yield parameter based on the number of irreparably bad electrode array panels at the array test stage and the number of bad electrode array panels that are not reparable at the array repair stage, and for estimating the production quantity of electrode array panels for achieving the predetermined monetary result based on the first yield parameter.
An article of manufacture, comprising:
- a computer usable medium having computer readable program code embodied therein for estimating a production quantity of electrode array panels required to achieve a predetermined monetary result in a liquid crystal display (LCD) manufacturing setup, wherein the LCD manufacturing setup comprises an array test stage and an array repair stage, the computer readable program code in the article of manufacture comprising:
- computer readable program code for causing a computer to determine, at the array test stage, a number of bad electrode array panels and a number of irreparably bad electrode array panels based on a test recipe;
- computer readable program code for causing a computer to determine, at the array repair stage, a number of the bad electrode array panels that are not reparable;
- computer readable program code for causing a computer to determine a first yield parameter based on the number of irreparably bad electrode array panels at the array test stage, and the number of bad electrode array panels that are not reparable at the array repair stage;
- and
- computer readable program code for causing a computer to estimate the production quantity of electrode array panels for achieving the predetermined monetary result based on the first yield parameter.
A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for estimating a production quantity of electrode array panels required to achieve a predetermined monetary result in a liquid crystal display (LCD) manufacturing setup, wherein the LCD manufacturing setup comprises an array test stage and an array repair stage, the method steps comprising:
- determining, at the array test stage, a number of bad electrode array panels and a number of irreparably bad electrode array panels based on a test recipe;
- determining, at the array repair stage, a number of the bad electrode array panels that are not reparable;
- determining a first yield parameter based on the number of irreparably bad electrode array panels at the array test stage, and the number of bad electrode array panels that are not reparable at the array repair stage;
- and
- estimating the production quantity of electrode array panels for achieving the predetermined monetary result based on the first yield parameter.
Dependencies are inferred from the claim text.