Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same

A method of detecting defects in an electrode array panel, wherein the electrode array panel defines a plurality of pixels, comprising the steps of:

• (a) applying a test signal to a group of pixels in the electrode array panel, wherein the group of pixels comprises a subset of the plurality of pixels defined by the electrode array panel;
• (b) measuring a voltage distribution of the group of pixels;
• (c) determining a standard deviation value of the voltage distribution;
• (d) calculating thresholding parameters based on the standard deviation value;
• (e) determining if each pixel in the group of pixels is defective based on the calculated thresholding parameters;
• and
• (f) repeating steps (a)–(e) for other groups of pixels in the electrode array panel until all the pixels in the electrode array panel have been tested.

A system for detecting defects in an electrode array, wherein the electrode array defines a plurality of pixels, comprising:

• an electrode array tester;
• and
• a controller, wherein the controller:
• controls the electrode array tester so that a test signal is applied to the plurality of pixels,
• determines a voltage distribution of the plurality of pixels from pixel voltages measured by the electrode array tester,
• determines a standard deviation value of the voltage distribution,
• calculates thresholding parameters based on the standard deviation value, and
• determines if a pixel is defective based on the calculated thresholding parameters.