inTEST IP Corporation
Cherry Hill, NJ, US· latest recorded location
inTEST IP Corporation is named on 9 US grants and 4 published applications in this corpus. Its most frequent classification is G01R (Measuring electric variables).
- Granted patents
- 9
- Published applications
- 4
- Inventors
- 12
- Granted in 2026 so far
- 0
- Most recent grant
- 16 Dec 2008
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2001 | 1 | 0 |
| 2002 | 2 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 2 |
| 2005 | 3 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
By publication year.
Technology areas
Share of 13 documents
- G01RMeasuring electric variables12
- B25JManipulators4
- H01RElectrically-conductive connections2
- Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests2
- Y10TTechnical subjects covered by former us classification2
- G01MTesting static or dynamic balance of machines or structures1
- G05BControl or regulating systems in general1
- H04BTransmission1
Recent patents
- Test head docking system and method16 Dec 2008US 7,466,122 B2
- Electrically shielded connector14 Feb 2006US 6,997,762 B2
- Side supports with adjustable center of gravity13 Dec 2005US 6,975,105 B2
- Safety lock system for test head mount28 Jun 2005US 6,911,816 B2
- Test head manipulator3 May 2005US 6,888,343 B1
Most cited
By later US patents
- Test head manipulator29US 6,888,343 B12005
- Apparatus for coupling a test head and probe card in a wafer testing system13US 6,259,260 B12001
- Optical fiber interface for integrated circuit test system7US 6,404,949 B12002
- Safety lock system for test head mount6US 6,911,816 B22005
- Method and apparatus automated docking of a test head to a device handler4US 6,448,797 B12002