Back to results
US 7,466,122 B2Granted
Test head docking system and method
AssigneeinTEST IP Corporation
InventorsNaum Gudin, Christopher L. West, I. Marvin Weilerstein, Nils. O. Ny, Alyn R. Holt
Life of this patent
Estimating the term…
Abstract
A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.
Claims7
A method of docking a test head with a handling apparatus comprising the steps of:
- detecting entry of at least one alignment feature into a respective alignment feature receptacle, said alignment feature being situated on one of said test head and said handling apparatus, said alignment feature receptacle being situated on the other of said test head and said handling apparatus;
- generating a detection signal responsive to detection of said entry;
- sensing a plurality of relative positions between said test head and said handling apparatus wherein at one of said positions at least one power driven actuator is operable to bring said test head and said handling apparatus towards each other;
- and
- generating a ready to actuate signal responsive to said one of said positions being sensed:
- actuating said at least one power driven actuator for bringing said test head and said handling apparatus towards each other, said actuating performed after said detection signal is generated and responsive to generation of said ready to actuate signal.
3 more elements
Dependencies are inferred from the claim text.