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US 6,448,797 B1Granted
Method and apparatus automated docking of a test head to a device handler
AssigneeinTEST IP Corporation
InventorsAlyn R. Holt, Daniel J. Graham, I. Marvin Weilerstein, Christopher L. West
Life of this patent
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Abstract
A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a support structure for moving the test head along a second axis orthogonal to the first axis. The support structure accurately docks the electronic test head with the device handler.
Claims15
A positioner for docking an electronic test head with a device handler, comprising:
- head rotation means for rotating said electronic test head about a first axis;
- motion means for moving said electronic test head along a second axis orthogonal to said first axis;
- sensor means for determining respective distances between a plurality of locations on at least one surface of said electronic test head and a respective plurality of locations on at least one surface of said device handler;
- and
- means for
- a) selectively signaling said head rotation means to rotate said electronic test head about said first axis;
- and
- b) selectively signaling said motion means to move said electronic test head along said second axis;
- responsive to said respective distances determined by said sensor means in order to dock said electronic test head with said device handler.
6 more elements
A method for docking an electronic test head with a device handler, comprising the steps of:
- rotating said electronic test head about a first axis;
- moving said electronic test head along a second axis orthogonal to said first axis;
- determining respective distances between a plurality of locations on at least one surface of said electronic test head and a respective plurality of locations on at least one surface of said device handler;
- and
- responsive to said respective distances determined between said plurality of locations on said at least one surface of said electronic test head and said respective plurality of locations on said at least one surface of said device handler:
- a) selectively signaling said head rotation means to rotate said electronic test head about said first axis;
- and
- b) selectively signaling said vertical motion means to move said electronic test head along said second axis;
- in order to dock said electronic test head with said device handler.
6 more elements
Dependencies are inferred from the claim text.