Fortune Semiconductor Corporation
Taipei Hsien, TW· latest recorded location
FORTUNE SEMICONDUCTOR CORPORATION is named on 5 US grants and 13 published applications in this corpus. Its most frequent classification is G01R (Measuring electric variables).
- Granted patents
- 5
- Published applications
- 13
- Inventors
- 13
- Granted in 2026 so far
- 0
- Most recent grant
- 23 Apr 2013
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2006 | 0 | 2 |
| 2007 | 2 | 0 |
| 2008 | 2 | 2 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 2 |
| 2012 | 0 | 5 |
| 2013 | 1 | 2 |
By publication year.
Technology areas
Share of 18 documents
- G01RMeasuring electric variables6
- H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by6
- G01DMeasuring not specially adapted for a specific variable2
- G04GElectronic time-pieces2
- G06FComputing and data processing2
- G11CStatic stores2
- H01MBatteries and fuel cells2
- Y02EClean energy generation and storage2
- H02JPower supply and charging1
- H10DInorganic electric semiconductor devices1
Recent patents
- Multi-chip module23 Apr 2013US 8,427,840 B2
- Method for programming one-time programmable memory of integrated circuit21 Oct 2008US 7,440,306 B2
- Integrated circuit with self-proofreading function and measuring device using the same23 Sep 2008US 7,428,474 B2
- Method and device for clock calibration3 Apr 2007US 7,200,507 B2
- Digital power meter apparatus and method for the same23 Jan 2007US 7,166,995 B2
- Packaging structure28 Mar 2013US 2013/0075880 A1
- Package structure28 Mar 2013US 2013/0075882 A1
- Polarity switch circuit for charger16 Aug 2012US 2012/0206194 A1
- Test mode controller and electronic apparatus with self-testing thereof19 Jul 2012US 2012/0182032 A1
- Circuit apparatus7 Jun 2012US 2012/0139569 A1
Most cited
By later US patents