H01J 9/42
Measurement or testing during manufacture
H01J9/42 (Measurement or testing during manufacture) appears on 174 US grants and 72 published applications in this corpus.
Search patents in H01J- Granted patents
- 174
- Published applications
- 72
- Assignees
- 101
- Inventors
- 393
- Latest grant
- 5 Aug 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 3 | 0 |
| 1978 | 3 | 0 |
| 1979 | 2 | 0 |
| 1980 | 2 | 0 |
| 1981 | 3 | 0 |
| 1982 | 2 | 0 |
| 1983 | 2 | 0 |
| 1984 | 2 | 0 |
| 1985 | 3 | 0 |
| 1986 | 2 | 0 |
| 1987 | 10 | 0 |
| 1988 | 4 | 0 |
| 1989 | 2 | 0 |
| 1990 | 4 | 0 |
| 1991 | 7 | 0 |
| 1992 | 7 | 0 |
| 1993 | 1 | 0 |
| 1994 | 3 | 0 |
| 1995 | 2 | 0 |
| 1996 | 3 | 0 |
| 1997 | 4 | 0 |
| 1998 | 2 | 0 |
| 1999 | 6 | 0 |
| 2000 | 11 | 0 |
| 2001 | 10 | 4 |
| 2002 | 5 | 8 |
| 2003 | 10 | 5 |
| 2004 | 4 | 6 |
| 2005 | 5 | 3 |
| 2006 | 3 | 9 |
| 2007 | 3 | 3 |
| 2008 | 5 | 6 |
| 2009 | 4 | 4 |
| 2010 | 5 | 1 |
| 2011 | 3 | 2 |
| 2012 | 2 | 3 |
| 2013 | 2 | 2 |
| 2014 | 3 | 1 |
| 2015 | 2 | 2 |
| 2016 | 3 | 2 |
| 2017 | 0 | 1 |
| 2018 | 2 | 1 |
| 2019 | 1 | 5 |
| 2020 | 4 | 2 |
| 2021 | 4 | 0 |
| 2022 | 0 | 1 |
| 2023 | 0 | 1 |
| 2024 | 1 | 0 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Tool for testing an electron-optical assembly5 Aug 2025US 12,381,062 B2ASML Netherlands B. V.
- Barrier coatings13 Feb 2024US 11,901,169 B2Incom, Inc.
- Partial discharge synthesizer23 Nov 2021US 11,181,570 B2Rosemount Inc.
- Measuring device and operation method of system for inspecting focus ring2 Nov 2021US 11,164,729 B2Tokyo Electron Limited
- Estimation of cathode space current for a thermionic vacuum tube using a polynomial based on a heuristically determined variable representing the grid and plate voltages19 Oct 2021US 11,152,181 B2Panayotis Tsambos
- Barrier coatings17 Aug 2023US 2023/0260736 A1Incom, Inc.
- Tool for testing an electron-optical assembly8 Dec 2022US 2022/0392729 A1ASML Netherlands B. V.
- A chip testing method and an apparatus for testing of a plurality of field emission light sources23 Jul 2020US 2020/0236753 A1Lightlab Sweden AB
- Electron emission element and method for same5 Mar 2020US 2020/0075285 A1Sharp Kabushiki Kaisha
- Partial discharge synthesizer19 Dec 2019US 2019/0383872 A1Rosemount Inc.
Most cited
By later US patents
- Light source having desired color temperature and chromaticity79US 5,144,190 AWelch Allyn, Inc. · 1992
- Method of adjusting a light source for color temperature and chromaticity60US 5,059,146 AWelch Allyn, Inc. · 1991
- Method for testing a light-emitting panel and the components therein54US 6,620,012 B1Science Applications International Corporation · 2003
- Optical interprogation system for use in constructing flat tension shadow mask CRTS48US 5,145,432 AZenith Electronics Corporation · 1992
- Test and alignment system for electronic display devices and test fixture for same47US 5,969,756 AImage Processing Systems, Inc. · 1999