H01J 49/147
With electrons
Official title: {with electrons, e.g. electron impact ionisation, electron attachment (H01J49/145 takes precedence)}
H01J49/147 (With electrons) appears on 199 US grants and 174 published applications in this corpus.
Search patents in H01J- Granted patents
- 199
- Published applications
- 174
- Assignees
- 115
- Inventors
- 382
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 4 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 2 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 7 | 0 |
| 1995 | 2 | 0 |
| 1996 | 3 | 0 |
| 1997 | 1 | 0 |
| 1998 | 4 | 0 |
| 1999 | 1 | 0 |
| 2000 | 3 | 0 |
| 2001 | 4 | 1 |
| 2002 | 1 | 1 |
| 2003 | 4 | 4 |
| 2004 | 0 | 1 |
| 2005 | 5 | 6 |
| 2006 | 5 | 6 |
| 2007 | 4 | 2 |
| 2008 | 5 | 2 |
| 2009 | 2 | 11 |
| 2010 | 3 | 4 |
| 2011 | 6 | 6 |
| 2012 | 6 | 6 |
| 2013 | 7 | 6 |
| 2014 | 6 | 9 |
| 2015 | 8 | 5 |
| 2016 | 8 | 10 |
| 2017 | 10 | 10 |
| 2018 | 4 | 9 |
| 2019 | 16 | 8 |
| 2020 | 10 | 12 |
| 2021 | 9 | 13 |
| 2022 | 7 | 11 |
| 2023 | 10 | 10 |
| 2024 | 10 | 10 |
| 2025 | 4 | 7 |
| 2026 | 2 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Magnet positioning system for ion source18 Aug 2026US 12,712,169 B2Thermo Finnigan LLC
- Mass spectrometer24 Mar 2026US 12,586,770 B2Shimadzu Corporation
- Ion source assembly with multiple elliptical filaments9 Dec 2025US 12,494,358 B2Inficon GmbH
- Ion source19 Aug 2025US 12,394,614 B2Agilent Technologies, Inc.
- Holding device for at least one filament and mass spectrometer15 Apr 2025US 12,278,100 B2Leybold Aktiengesellschaft
- Method of mass spectrometry for the detection of perfluoroalkyl or polyfluoroalkyl substances (pfas)24 Sep 2026US 2026/0287565 A1Thermo Fisher Scientific (Bremen) GmbH
- Mass spectrometer and calibration method for mass spectrometer20 Aug 2026US 2026/0245848 A1Hitachi High-Tech Corporation
- Quadrupole mass analyzing apparatus2 Jul 2026US 2026/0188638 A1HORIBA STEC, Co., Ltd.
- Health degradation monitoring of scientific measurement device4 Jun 2026US 2026/0155343 A1HighChem s. r. o.
- Mass spectrometry method and mass spectrometer30 Oct 2025US 2025/0336658 A1Shimadzu Corporation
Most cited
By later US patents
- Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer92US 5,572,022 AFinnigan Corporation · 1996
- Analytical apparatus with variable energy ion beam source60US 4,016,421 AE. I. Du Pont de Nemours and Company · 1977
- Mass spectrometer57US 4,144,451 AHitachi, Ltd. · 1979
- Programmed electron flux55US 6,255,648 B1Applied Automation, Inc. · 2001
- Pulsed ion source for ion trap mass spectrometer54US 6,294,780 B1Varian, Inc. · 2001