Ion source
AssigneeAgilent Technologies, Inc.
InventorsBruce D. Quimby, Anastasia A. Andrianova
Life of this patent
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Abstract
Provided herein is an ion source containing a plurality of components, at least one of which is partially coated with a layer of silicon. The ion source reduces reactivity between the sample and the carrier gas, reduces or eliminates tailing in ion chromatograms, and/or improves mass spectral fidelity. Also provided are methods of using the ion source in a mass spectrometer or gas chromatograph-mass spectrometer.
Claims17
A method of analyzing a sample with a mass spectrometer, the method comprising:
- flowing the sample in a carrier gas comprising hydrogen through a sample entrance of the mass spectrometer;
- ionizing the sample using an ion source of the mass spectrometer, the ion source comprising:
- a plurality of components defining a flow path therethrough, an inner surface of at least one of the plurality of components having a coating of a layer of silicon, silicon hydride, or a combination thereof, the coating having a thickness between about 400 Angstroms to 1000 Angstroms;
- and
- analyzing the ions based on ion mass.
A method of facilitating analysis of a sample with a mass spectrometer, comprising:
- providing an ion source connectable to a mass spectrometer, the ion source comprising a plurality of components defining a flow path therethrough, an inner surface of at least one of the plurality of components having a coating of a layer of silicon, silicon hydride, or a combination thereof, the coating having a thickness between about 400 Angstroms to 1000 Angstroms;
- and
- providing instructions to connect the ion source to the mass spectrometer.
An ion source, comprising:
- a sample entrance;
- and
- a plurality of components defining a flow path therethrough, an inner surface of at least one of the plurality of components having a coating of a layer of silicon, silicon hydride, or a combination thereof, the coating having a thickness of from about 400 Angstroms to about 1000 Angstroms.
Dependencies are inferred from the claim text.