H01J 2203/026
Relative position to the gateelectrodes, emitters, cathodes or substrates
H01J2203/026 (Relative position to the gateelectrodes, emitters, cathodes or substrates) appears on 2 US grants and 1 published applications in this corpus.
Search patents in H01J- Granted patents
- 2
- Published applications
- 1
- Assignees
- 2
- Inventors
- 1
- Latest grant
- 25 Jan 2022
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| Year | Granted patents | Published applications |
|---|---|---|
| 2020 | 1 | 0 |
| 2021 | 0 | 1 |
| 2022 | 1 | 0 |
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- Method of operating a charged particle gun, charged particle gun, and charged particle beam device25 Jan 2022US 11,232,924 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Method of operating a charged particle gun, charged particle gun, and charged particle beam device8 Dec 2020US 10,861,666 B1ICT Integrated Circuit Testing Gesellschaft für Halbletterprüftechnik mbH
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